"Scanning near-field optical microscopy (SNOM) is a technique of imaging used for mapping optical near-field signals by detecting evanescent waves, enabling a resolution beyond the diffraction limit, i.e., a lateral and vertical resolution much smaller than the operation wavelength. SNOM has the ability to measure both optical and topographic data in a single scan. In this thesis, we propose the development and optimization of a low-cost SNOM capable of measuring nanoscale topographies and near-field optical signals, such as surface plasmon polaritons. The SNOM uses a shear-force feedback control to set the distance between the probe and the sample (∼ 20 nm) along the entire scan.The results obtained include a stable control system with fast response. The system can provide precise quantitative topographic and optical measurements. Also, an optical method for distance and displacement measurements of the probe-sample separation was developed. "--Resumen hoja v.

Scanning near-field optical microscopy (SNOM, also known as NSOM) is a new local probe technique with a resolving power of 10--50 nm. Not being limited by diffraction, near-field optics (NFO) opens new perspectives for optical characterization and the understanding of optical phenomena, in particular in biology, microelectronics and materials science. SNOM, after first demonstrations in '83/'84, has undergone a rapid development in the past two to four years. The increased interest has been largely stimulated by the wealth of optical properties that can be investigated and the growing importance of characterization on the nanometer scale in general. Examples include the use of fluorescence, birefrigence and plasmon effects for applications in particular in biology, microelectronics and materials science, to name just a few. This volume emerged from the first international meeting devoted exclusively to NFO, and comprises a complete survey of the 1992 activities in the field, in particular the variety of instrumental techniques that are currently being explored, the demonstration of the imaging capabilities as well as theoretical interpretations - a highly nontrivial task. The comprehensive collection of papers devoted to these and related subjects make the book a valuable tool for anybody interested in near-field optics.

This work covers review papers on scanning near-field optical microscopy, early ideas and concepts, development of scanning near-field optical microscopy in the 1990s, theoretical analysis of near-field optics, and resolution of scanning near-field optical microscopy.