Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

This book is the second of two volumes addressing the design challenges associated with new generations of semiconductor technology. The various chapters are compiled from tutorials presented at workshops in recent years by prominent authors from all over the world. Technology, productivity and quality are the main aspects under consideration to establish the major requirements for the design and test of upcoming systems on a chip.

Various aspects of system-on-a-chip (SOC) integrated circuit testing are addressed in 13 papers on test planning, access, and scheduling; test data compression; and interconnect, crosstalk, and signal integrity. Topics include concurrent test of core-based SOC design and testing for interconnect crosstalk defects using on-chip embedded processor cores. The editor is affiliated with Duke University. The book is reprinted from a Special Issue of the Journal of Electronic Testing, vol. 18, nos. 4 & 5. There is no subject index. Annotation (c)2003 Book News, Inc., Portland, OR (booknews.com).

This book describes the various tradeoffs systems designers face when designing embedded memory. Readers designing multi-core systems and systems on chip will benefit from the discussion of different topics from memory architecture, array organization, circuit design techniques and design for test. The presentation enables a multi-disciplinary approach to chip design, which bridges the gap between the architecture level and circuit level, in order to address yield, reliability and power-related issues for embedded memory.

The Arm(R) Cortex(R)-M processors are already one of the most popular choices for loT and embedded applications. With Arm Flexible Access and DesignStart(TM), accessing Arm Cortex-M processor IP is fast, affordable, and easy. This book introduces all the key topics that system-on-chip (SoC) and FPGA designers need to know when integrating a Cortex-M processor into their design, including bus protocols, bus interconnect, and peripheral designs. Joseph Yiu is a distinguished Arm engineer who began designing SoCs back in 2000 and has been a leader in this field for nearly twenty years. Joseph's book takes an expert look at what SoC designers need to know when incorporating Cortex-M processors into their systems. He discusses the on-chip bus protocol specifications (AMBA, AHB, and APB), used by Arm processors and a wide range of on-chip digital components such as memory interfaces, peripherals, and debug components. Software development and advanced design considerations are also covered. The journey concludes with 'Putting the system together', a designer's eye view of a simple microcontroller-like design based on the Cortex-M3 processor (DesignStart) that uses the components that you will have learned to create.

This book originated from a workshop held at the DATE 2005 conference, namely Designing Complex SOCs. State-of-the-art in issues related to System-on-Chip (SoC) design by leading experts in the fields, it covers IP development, verification, integration, chip implementation, testing and software. It contains valuable academic and industrial examples for those involved with the design of complex SOCs.