This book presents the a scientific discussion of the state-of-the-art techniques and designs for modeling, testing and for the performance analysis of data converters. The focus is put on sustainable data conversion. Sustainability has become a public issue that industries and users can not ignore. Devising environmentally friendly solutions for data conversion designing, modeling and testing is nowadays a requirement that researchers and practitioners must consider in their activities. This book presents the outcome of the IWADC workshop 2011, held in Orvieto, Italy.

This comprehensive guide offers a detailed treatment of the analysis, design, simulation and testing of the full range of today's leading delta-sigma data converters. Written by professionals experienced in all practical aspects of delta-sigma modulator design, Delta-Sigma Data Converters provides comprehensive coverage of low and high-order single-bit, bandpass, continuous-time, multi-stage modulators as well as advanced topics, including idle-channel tones, stability, decimation and interpolation filter design, and simulation.

Data converters are a particularly important class of mixed-signal circuit. Their performance improves with time, driven by market forces leading to developments in design and manufacturing processes. Device testing, however, is becoming a bottleneck as available tester resources are limited in terms of accuracy when test time is limited. Model-based testing has been proposed to address this problem. In chapter 2 of this thesis, we demonstrate model-based testing for a 12-bit DAC, following an algorithm originally proposed by the National Institute of Standards and Technology (NIST), which marks the starting point of the work. We identify shortcomings with the NIST algorithm and open questions that are addressed in the remainder of the thesis. Based on the experience with DAC modeling, we apply our refined modeling procedures to a 12-bit ADC in Chapter 3. For this device, we demonstrate advantages and discuss trade-offs when model-based testing is applied in a production test environment. In a trial run, testing two wafer lots of devices, the robustness of the model is demonstrated in the presence of significant manufacturing process drifts. The choice of test conditions is discussed in Chapter 4. Experimental evidence is given that a test condition which yields more precise model parameter estimates is advantageous. In the example, the same condition is used for another test performed on the devices; thus, measurements can be shared between both tests. The idea is taken further towards Design-for-Testability considerations and towards Design-for-Test, reducing measurement accuracy limitations that are encountered for high-resolution data converters. In Chapter 5, test point selection strategies are discussed. In particular, structural faults are considered, and a novel test point selection algorithm is developed to cover hard-faults. This algorithm yields a single set of test points that provides hard-fault coverage as well as serving the model-based device parameter extraction that is a cornerstone of the test effort reduction technique based on linear modeling. In Chapter 6, we apply the modeling techniques developed previously to characterize the influence of the manufacturing process on device performance. In this application, we exploit design information that was used to form the a priori model. Certain types of design changes can be accommodated in this model and the performance of a re-design can be predicted. We consider re-sizing of circuit elements and digital calibration techniques as examples of possible re-designs.

This complete update of a classic handbook originally created by Analog Devices and never previously published offers the most complete and up-to-date reference available on data conversion, from the world authority on the subject. It describes in depth the theory behind and the practical design of data conversion circuits. It describes the different architectures used in A/D and D/A converters - including many advances that have been made in this technology in recent years - and provides guidelines on which types are best suited for particular applications. It covers error characterization and testing specifications, essential design information that is difficult to find elsewhere. The book also contains a wealth of practical application circuits for interfacing and supporting A/D and D/A converters within an electronic system. In short, everything an electronics engineer needs to know about data converters can be found in this volume, making it an indispensable reference with broad appeal. The accompanying CD-ROM provides software tools for testing and analyzing data converters as well as a searchable pdf version of the text. * brings together a huge amount of information impossible to locate elsewhere. * many recent advances in converter technology simply aren't covered in any other book. * a must-have design reference for any electronics design engineer or technician

This advanced text and reference covers the design and implementation of integrated circuits for analog-to-digital and digital-to-analog conversion. It begins with basic concepts and systematically leads the reader to advanced topics, describing design issues and techniques at both circuit and system level. Gain a system-level perspective of data conversion units and their trade-offs with this state-of-the art book. Topics covered include: sampling circuits and architectures, D/A and A/D architectures; comparator and op amp design; calibration techniques; testing and characterization; and more!

Switch-Mode Power Converters introduces an innovative, highly analytical approach to symbolic, closed-form solutions for switched-mode power converter circuits. This is a highly relevant topic to power electronics students and professionals who are involved in the design and analysis of electrical power converters. The author uses extensive equations to explain how solid-state switches convert electrical voltages from one level to another, so that electronic devices (e.g., audio speakers, CD players, DVD players, etc.) can use different voltages more effectively to perform their various functions. Most existing comparable books published as recently as 2002 do not discuss closed-loop operations, nor do they provide either DC closed-loop regulation equations or AC loop gain (stability) formulae. The author Wu, a leading engineer at Lockheed Martin, fills this gap and provides among the first descriptions of how error amplifiers are designed in conjunction with closed-loop bandwidth selection. BENEFIT TO THE READER: Readers will gain a mathematically rigorous introduction to numerous, closed-form solutions that are readily applicable to the design and development of various switch-mode power converters. Provides symbolic, closed-form solutions for DC and AC studies Provides techniques for expressing close-loop operation Gives readers the ability to perform closed-loop regulation and sensitivity studies Gives readers the ability to design error amplifiers with precision Employs the concept of the continuity of states in matrix form Gives accelerated time-domain, steady-state studies using Laplace transform Gives accelerated time-domain studies using state transition Extensive use of matrix, linear algebra, implicit functions, and Jacobian determinants Enables the determination of power stage gain that otherwise could not be obtained

This now famous anthology brings together various aspects of oversampling methods and compares and evaluates design approaches. It describes the theoretical analysis of converter performances, the actual design of converters and their simulation, circuit implementations, and applications.