Copper Interconnect Technology
Title | Copper Interconnect Technology PDF eBook |
Author | Tapan Gupta |
Publisher | Springer Science & Business Media |
Pages | 433 |
Release | 2010-01-22 |
Genre | Technology & Engineering |
ISBN | 1441900764 |
Since overall circuit performance has depended primarily on transistor properties, previous efforts to enhance circuit and system speed were focused on transistors as well. During the last decade, however, the parasitic resistance, capacitance, and inductance associated with interconnections began to influence circuit performance and will be the primary factors in the evolution of nanoscale ULSI technology. Because metallic conductivity and resistance to electromigration of bulk copper (Cu) are better than aluminum, use of copper and low-k materials is now prevalent in the international microelectronics industry. As the feature size of the Cu-lines forming interconnects is scaled, resistivity of the lines increases. At the same time electromigration and stress-induced voids due to increased current density become significant reliability issues. Although copper/low-k technology has become fairly mature, there is no single book available on the promise and challenges of these next-generation technologies. In this book, a leader in the field describes advanced laser systems with lower radiation wavelengths, photolithography materials, and mathematical modeling approaches to address the challenges of Cu-interconnect technology.
Copper Interconnect Technology
Title | Copper Interconnect Technology PDF eBook |
Author | Christoph Steinbruchel |
Publisher | SPIE Press |
Pages | 138 |
Release | 2001 |
Genre | Science |
ISBN | 9780819438973 |
A textbook designed to accompany The Society of Photo-Optical Instrumentation Engineers' short course on improving interconnect performance for increased speed in overall circuit performance authored by Steinbrnchel (materials science and engineering, Renselaer Polytechnic Institute) and Chin (senio
Copper Interconnects, New Contact Metallurgies/Structures, and Low-k Inter-level Dielectrics
Title | Copper Interconnects, New Contact Metallurgies/Structures, and Low-k Inter-level Dielectrics PDF eBook |
Author | G. Mathad |
Publisher | The Electrochemical Society |
Pages | 71 |
Release | 2009-03 |
Genre | Science |
ISBN | 1566776937 |
The papers included in this issue of ECS Transactions were originally presented in the symposium ¿Low k Inter-Level Metal Dielectrics and New Contact and Barrier Metallurgies/Structures¿, held during the PRiME 2008 joint international meeting of The Electrochemical Society and The Electrochemical Society of Japan, with the technical cosponsorship of the Japan Society of Applied Physics, the Korean Electrochemical Society, the Electrochemistry Division of the Royal Australian Chemical Institute, and the Chinese Society of Electrochemistry. This meeting was held in Honolulu, Hawaii, from October 12 to 17, 2008.
Copper -- Fundamental Mechanisms for Microelectronic Applications
Title | Copper -- Fundamental Mechanisms for Microelectronic Applications PDF eBook |
Author | Shyam P. Murarka |
Publisher | Wiley-Interscience |
Pages | 376 |
Release | 2000-04-06 |
Genre | Science |
ISBN |
A complete guide to the state of the art and future direction of copper interconnect technology Owing to its performance advantages, copper metallization for IC interconnect is attracting tremendous interest in the semiconductor community worldwide. This timely book provides scientists and engineers with a much-needed, comprehensive reference on the fundamentals and applications of this emerging technology. The authors draw on more than a decade of intimate involvement with copper interconnect research, integrating the vast amounts of available knowledge and making clear the connection between mechanistic principles and relevant technologies. In-depth, cutting-edge discussions include: * The effects of copper in semiconductor materials, especially silicon * The fundamental chemistry and electro-chemistry of copper * The effects of copper on insulating materials such as glass and polymers * Intermetallic and interfacial reactions of copper in layered structures * Current and projected applications of copper in integrated circuits Copper-Fundamental Mechanisms for Microelectronic Applications also features extensive references, tables, and over 100 illustrations-including dual Damascene patterning necessary for copper interconnects. It is an excellent resource for anyone seeking to explore the current literature and gain insight into opportunities opening in the field.
Interconnect Technology and Design for Gigascale Integration
Title | Interconnect Technology and Design for Gigascale Integration PDF eBook |
Author | Jeffrey A. Davis |
Publisher | Springer Science & Business Media |
Pages | 417 |
Release | 2012-12-06 |
Genre | Technology & Engineering |
ISBN | 1461504619 |
This book is jointly authored by leading academic and industry researchers. The material is unique in that it spans IC interconnect topics ranging from IBM's revolutionary copper process to an in-depth exploration into interconnect-aware computer architectures.
Advanced Interconnects for ULSI Technology
Title | Advanced Interconnects for ULSI Technology PDF eBook |
Author | Mikhail Baklanov |
Publisher | John Wiley & Sons |
Pages | 616 |
Release | 2012-02-17 |
Genre | Technology & Engineering |
ISBN | 1119966868 |
Finding new materials for copper/low-k interconnects is critical to the continuing development of computer chips. While copper/low-k interconnects have served well, allowing for the creation of Ultra Large Scale Integration (ULSI) devices which combine over a billion transistors onto a single chip, the increased resistance and RC-delay at the smaller scale has become a significant factor affecting chip performance. Advanced Interconnects for ULSI Technology is dedicated to the materials and methods which might be suitable replacements. It covers a broad range of topics, from physical principles to design, fabrication, characterization, and application of new materials for nano-interconnects, and discusses: Interconnect functions, characterisations, electrical properties and wiring requirements Low-k materials: fundamentals, advances and mechanical properties Conductive layers and barriers Integration and reliability including mechanical reliability, electromigration and electrical breakdown New approaches including 3D, optical, wireless interchip, and carbon-based interconnects Intended for postgraduate students and researchers, in academia and industry, this book provides a critical overview of the enabling technology at the heart of the future development of computer chips.
Investigation of Self-assembled Monolayers as Diffusion Barriers for Copper Interconnect Technology
Title | Investigation of Self-assembled Monolayers as Diffusion Barriers for Copper Interconnect Technology PDF eBook |
Author | Kaushik Chanda |
Publisher | |
Pages | 62 |
Release | 2001 |
Genre | |
ISBN |