Abstract: Oxygen precipitates are among the most detrimental oxygen-related silicon bulk defects formed during solar cell manufacturing. These defects are formed only during high-temperature processes, impeding an identification of prone materials during incoming inspection. Moreover, the prediction of oxygen-precipitate-related bulk charge carrier recombination currently requires advanced numerical simulation. This work presents an easily implementable model to predict the bulk carrier lifetime limit, using the temperature-time profile of a high-temperature process as well as the material properties as the input data. In addition to published analytical descriptions of oxygen precipitation, an empirical description of the retarded growth of small precipitates is included. Furthermore, the time-lag in nucleation is explicitly considered, which is, to our knowledge, not implemented in oxygen precipitation modeling so far. The calibration of the two free parameters of the model is achieved using the experimental data of 19 different thermal process combinations performed using a single material. This results in a good agreement not only for the material used for calibration but also for other silicon materials. A validation based on passivated emitter and rear cells as well as on test structures confirms the ability of the model to predict bulk carrier lifetimes after solar cell processing

About 30% of the total market share of industrial manufacture of silicon solar cells is taken by single crystalline Czochralski (CZ) grown wafers. The efficiency of solar cells fabricated on boron-doped Czochralski silicon degrades due to the formation of metastable defects when excess electrons are created by illumination or minority carrier injection during forward bias. The recombination path can be removed by annealing the cell at about 200° C but recombination returns on exposure to light. Several mono-crystalline and multi-crystalline solar cells have been characterized by methods such as laser beam induced current (LBIC), Four-Probe electrical resistivity etc. to better understand the light induced degradation (LID) effect in silicon solar cells. All the measurements are performed as a function of light soaking time. Annealed states are produced by exposing the cells/wafer to temperature above 200° C for 30 minutes and light soaked state was produced by exposure to 1000 W/m2 light using AM1.5 solar simulator for 72 hours. Dark I-V data are analyzed by a software developed at NREL. This study shows that LID, typically, has two components- a bulk component that arises from boron-oxygen defects and a surface component that appears to be due to the SiNx:H-Si interface. With the analysis of dark saturation current (J02), it is seen that the surface LID increases with an increase in the q/2kT component. Results show that cell performance due to bulk effect is fully recovered upon annealing where as surface LID does not recover fully. This statement is also verified by the study of mc- silicon solar cells. Multi-crystalline silicon solar cell has very low oxygen content and, therefore, recombination sites will not be able to form. This shows that there is no bulk degradation in mc- Si solar cells but they exhibit surface degradation. The results suggest that a typical Cz-silicon solar cell with an initial efficiency of - 18% could suffer a reduction in efficiency to - 17.5% after the formation of a metastable defect, out of which - 0.4% comes from a bulk effect and - 0.1 % is linked to a surface effect.

The utilization of sun light is one of the hottest topics in sustainable energy research. To efficiently convert sun power into a reliable energy – electricity – for consumption and storage, silicon and its derivatives have been widely studied and applied in solar cell systems. This handbook covers the photovoltaics of silicon materials and devices, providing a comprehensive summary of the state of the art of photovoltaic silicon sciences and technologies. This work is divided into various areas including but not limited to fundamental principles, design methodologies, wafering techniques/fabrications, characterizations, applications, current research trends and challenges. It offers the most updated and self-explanatory reference to all levels of students and acts as a quick reference to the experts from the fields of chemistry, material science, physics, chemical engineering, electrical engineering, solar energy, etc..

Solar cells with thin Cu(In,Ga)(S,Se)2 absorber films are well established in the photovoltaics market. They offer an advantage over other thin film technologies thanks to their lower content of elements with high toxicity or low earth abundance like Cd and Te. One approach to further improve the quality of production of these cells is to develop a method of material quality assessment during production that is fast, contactless and non-destructive. Time-resolved photoluminescence (TRPL) measurements offer all these characteristics. This work aims to establish the requirements to extract meaningful information about charge carrier recombination dynamics and solar cell performance parameters from TRPL measurements. To achieve this goal experiments and simulations are carried out. The material parameters are extracted from experiments and then built into the simulation model. Results from experiments also serve as the basis to verify the validity of this model. Parameter variations within the simulations function as one of the main methods in this work to gain deeper physical insight into the processes taking place during TRPL measurements. engl.

Silicon, as a single-crystal semiconductor, has sparked a revolution in the field of electronics and touched nearly every field of science and technology. Though available abundantly as silica and in various other forms in nature, silicon is difficult to separate from its chemical compounds because of its reactivity. As a solid, silicon is chemically inert and stable, but growing it as a single crystal creates many technological challenges. Crystal Growth and Evaluation of Silicon for VLSI and ULSI is one of the first books to cover the systematic growth of silicon single crystals and the complete evaluation of silicon, from sand to useful wafers for device fabrication. Written for engineers and researchers working in semiconductor fabrication industries, this practical text: Describes different techniques used to grow silicon single crystals Explains how grown single-crystal ingots become a complete silicon wafer for integrated-circuit fabrication Reviews different methods to evaluate silicon wafers to determine suitability for device applications Analyzes silicon wafers in terms of resistivity and impurity concentration mapping Examines the effect of intentional and unintentional impurities Explores the defects found in regular silicon-crystal lattice Discusses silicon wafer preparation for VLSI and ULSI processing Crystal Growth and Evaluation of Silicon for VLSI and ULSI is an essential reference for different approaches to the selection of the basic silicon-containing compound, separation of silicon as metallurgical-grade pure silicon, subsequent purification, single-crystal growth, and defects and evaluation of the deviations within the grown crystals.