This book covers the complete spectrum of the fundamentals of clocked, regenerative comparators, their state-of-the-art, advanced CMOS technologies, innovative comparators inclusive circuit aspects, their characterization and properties. Starting from the basics of comparators and the transistor characteristics in nanometer CMOS, seven high-performance comparators developed by the authors in 120nm and 65nm CMOS are described extensively. Methods and measurement circuits for the characterization of advanced comparators are introduced. A synthesis of the largely differing aspects of demands on modern comparators and the properties of devices being available in nanometer CMOS, which are posed by the so-called nanometer hell of physics, is accomplished. The book summarizes the state of the art in integrated comparators. Advanced measurement circuits for characterization will be introduced as well as the method of characterization by bit-error analysis usually being used for characterization of optical receivers. The book is compact, and the graphical quality of the illustrations is outstanding. This book is written for engineers and researchers in industry as well as scientists and Ph.D students at universities. It is also recommendable to graduate students specializing on nanoelectronics and microelectronics or circuit design.

This book constitutes the refereed proceedings of the 14th IFIP WG 5.5/SOCOLNET Advanced Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2023, held in Monte da Caparica, Portugal, during July 5-7, 2022. The 22 full papers presented were carefully reviewed and selected from 47 submissions. The papers cover the following topics: energy communities; smart energy and power systems; intelligent manufacturing; health and biomedical information systems; intelligent computational systems; and electronics and communications.

This book discusses data communication and computer networking, communication technologies and the applications of IoT (Internet of Things), big data, cloud computing and healthcare informatics. It explores, examines and critiques intelligent data communications and presents inventive methodologies in communication technologies and IoT. Aimed at researchers and academicians who need to understand the importance of data communication and advanced technologies in IoT, it offers different perspectives to help readers increase their knowledge and motivates them to conduct research in the area, highlighting various innovative ideas for future research.

This book comprises selected peer-reviewed papers from the International Conference on VLSI, Signal Processing, Power Systems, Illumination and Lighting Control, Communication and Embedded Systems (VSPICE-2019). The contents are divided into five broad topics - VLSI and embedded systems, signal processing, power systems, illumination and control, and communication and networking. The book focuses on the latest innovations, trends, and challenges encountered in the different areas of electronics and communication, and electrical engineering. It also offers potential solutions and provides an insight into various emerging areas such as image fusion, bio-sensors, and underwater sensor networks. This book can prove to be useful for academics and professionals interested in the various sub-fields of electronics and communication engineering.

This book gathers selected high-impact articles from the 1st International Conference on Data Science, Machine Learning & Applications 2019. It highlights the latest developments in the areas of Artificial Intelligence, Machine Learning, Soft Computing, Human–Computer Interaction and various data science & machine learning applications. It brings together scientists and researchers from different universities and industries around the world to showcase a broad range of perspectives, practices and technical expertise.

This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.

This volume presents the selected papers of the First International Conference on Fundamental Research in Electrical Engineering, held at Khwarazmi University, Tehran, Iran in July, 2017. The selected papers cover the whole spectrum of the main four fields of Electrical Engineering (Electronic, Telecommunications, Control, and Power Engineering).