CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.

Realist Evaluation: Principles and Practice offers a comprehensive exploration of contemporary realist evaluation, showcasing how skilled practitioners navigate diverse fieldwork contexts. Authored by experts spanning academia and evaluation backgrounds across five continents in fields including climate change, criminology, health, and international development, the book provides a rich tapestry of perspectives. Covering participatory approaches, digital and visual data collection, interpreter-mediated interviews, and innovative methods like refuse data analysis, the authors delve into contemporary social research methodologies while addressing issues such as power, insider/outsider research, the nature of evidence, critical and scientific realism philosophies of science, and confirmation bias in qualitative research. Practical advice is provided in areas such as developing a topic guide, combining a realist review with an evaluation, and managing large, multi-site cross-national projects. This collection underscores the creative nature of the realist imagination, highlighting ongoing innovations by scholars and evaluators. With contributions from an outstanding group of internationally renowned experts in realist evaluation including Nick Tilley, a key figure in the development of realist evaluation alongside Ray Pawson, this is the ideal text for students, researchers and professionals including policy makers, professional evaluators, and those at organisations such as thinktanks and NGOs, who require an accessible guide on how to use realist evaluation methods.

Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through every key area, including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.

This book constitutes the proceedings of the 6th International Conference on Nonlinear Speech Processing, NOLISP 2013, held in Mons, Belgium, in June 2013. The 27 refereed papers included in this volume were carefully reviewed and selected from 34 submissions. The paper are organized in topical sections on speech and audio analysis; speech synthesis; speech-based biomedical applications; automatic speech recognition; and speech enhancement.