This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.

Volume is indexed by Thomson Reuters BCI (WoS). Nowadays, an impressively large number of powerful characterization techniques is being used by physicists, chemists, biologists and engineers in order to solve analytical research problems; especially those related to the investigation of the properties of new materials for advanced applications. Although there are a few available books which deal with such experimental techniques, they are either too exhaustive and cover very few techniques or are too elementary to provide a solid basis for learning to use the characterization technique. Moreover, such books usually over-emphasize the textbook approach: being full of theoretical concepts and mathematical derivations, and omitting the practical instruction required in order to permit newcomers to use the techniques.

These papers by leading experts look at current methods for synthesizing new materials. The methods presented include chemical vapor deposition synthesis, solution synthesis, pyrolysis and combustion synthesis, and polymer synthesis. Featuring in-depth coverage of ceramic materials, the volume also discusses group III nitrides, fullerenes, and ferroelectrics.

Over much of the last three decades, the evolution of techniques for characterizing composite materials has struggled to keep up with the advances of composite materials themselves and their broadening areas of application. In recent years, however, much work has been done to consolidate test methods and better understand those being used. Finally,

This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential side of this book. Moreover, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of functional nanomaterials. The book provides an overview of widely used characterization techniques for a broad audience: from beginners and graduate students, to advanced specialists in both academia and industry.

Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.

The importance of the nanoscale effects has been recognized in materials research for over fifty years, but it is only recently that advanced characterization and fabrication methods are enabling scientists to build structures atom-by-atom or molecule-by molecule. The understanding and control of the nanostructure has been, to a large extent, made possible by new atomistic analysis and characterization methods pioneered by transmission electron microscopy. Nano and Microstructural Design of Advanced Materials focuses on the effective use of such advanced analysis and characterization techniques in the design of materials. - Teaches effective use of advanced analysis and characterization methods at an atomistic level - Contains many supporting examples of materials in which such design concepts have been successfully applied