The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. Much like earlier books in the series, this collection of papers, first published in 2001, brings together the materials science community and the characterization techniques that use synchrotron radiation.

The 57 papers update the status of characterization techniques that use synchrotron radiation since the previous symposium on the subject in the spring of 1996. The techniques considered include X-ray absorption and scattering, imaging, tomography, microscopy, and topographic methods. Among the materials are surfaces, interfaces, electronic materials, metal oxides, solar cells, thin films, carbides, polymers, alloys, nanoparticles, and graphitic materials. Some of the papers are doubled spaced. Annotation copyrighted by Book News, Inc., Portland, OR

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This book, first published in 2002, focuses on the materials science of MEMS structures and the films involved to create those structures.

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

This book focuses on materials issues related to Cu(In,Ga)(Se,S)2 and CdTe-based polycrystalline thin-film photovoltaic solar cells and related oxides and chalcogenides. Phase equilibrium and thermochemical kinetic aspects of the absorber layer formation of CdTe and Cu(In,Ga)(Se,S)2 are emphasized and several papers on micro-analytical analysis report on detailed structural properties of thin films. The use of flexible plastic or metal foil substrates as an alternative to glass is addressed in terms of solar-cell performance and limitations imposed by the nature of the substrates. Properties of defects and interfaces in CdTe and CIGSS are highlighted using electrical, optical, and micro-analytical tools. While film properties are correlated to device physics, controversy still exists on the detailed operation of both CdTe and CIGSS devices. Topics include: materials and synthesis; thin films on alternate substrates; defects; growth and junction formation; surfaces and interfaces and film and device characterization.