This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references

Advances in Food Authenticity Testing covers a topic that is of great importance to both the food industry whose responsibility it is to provide clear and accurate labeling of their products and maintain food safety and the government agencies and organizations that are tasked with the verification of claims of food authenticity. The adulteration of foods with cheaper alternatives has a long history, but the analytical techniques which can be implemented to test for these are ever advancing. The book covers the wide range of methods and techniques utilized in the testing of food authenticity, including new implementations and processes. The first part of the book examines, in detail, the scientific basis and the process of how these techniques are used, while other sections highlight specific examples of the use of these techniques in the testing of various foods. Written by experts in both academia and industry, the book provides the most up-to-date and comprehensive coverage of this important and rapidly progressing field. Covers a topic that is of great importance to both the food industry and the governmental agencies tasked with verifying the safety and authenticity of food products Presents a wide range of methods and techniques utilized in the testing of food authenticity, including new implementations and processes Highlights specific examples of the use of the emerging techniques and testing strategies for various foods

Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.

The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.

Enterprise Java developers must achieve broader, deeper test coverage, going beyond unit testing to implement functional and integration testing with systematic acceptance. Next Generation JavaTM Testing introduces breakthrough Java testing techniques and TestNG, a powerful open source Java testing platform. Cédric Beust, TestNG's creator, and leading Java developer Hani Suleiman, present powerful, flexible testing patterns that will work with virtually any testing tool, framework, or language. They show how to leverage key Java platform improvements designed to facilitate effective testing, such as dependency injection and mock objects. They also thoroughly introduce TestNG, demonstrating how it overcomes the limitations of older frameworks and enables new techniques, making it far easier to test today's complex software systems. Pragmatic and results-focused, Next Generation JavaTM Testing will help Java developers build more robust code for today's mission-critical environments. This book Illuminates the tradeoffs associated with testing, so you can make better decisions about what and how to test Introduces TestNG, explains its goals and features, and shows how to apply them in real-world environments Shows how to integrate TestNG with your existing code, development frameworks, and software libraries Demonstrates how to test crucial code features, such as encapsulation, state sharing, scopes, and thread safety Shows how to test application elements, including JavaEE APIs, databases, Web pages, and XML files Presents advanced techniques: testing partial failures, factories, dependent testing, remote invocation, cluster-based test farms, and more Walks through installing and using TestNG plug-ins for Eclipse, and IDEA Contains extensive code examples Whether you use TestNG, JUnit, or another testing framework, the testing design patterns presented in this book will show you how to improve your tests by giving you concrete advice on how to make your code and your design more testable.