Testing and characterizing of Analog to Digital Converter (ADC) is still a challenging concern for real time mixed signal analysis, manufacturers and designers for consideration of factor like cost and time. The goal of such process is to validate in a short time whether a given ADC unite its performance requirements. ADC is an important device generally used in today's advanced communication and electronics applications like: microwave system, military applications, satellite communication and medical application for interfacing analog electronics with digital electronics. The ADC testing is mainly resolute by three technologies: linear stimulus generation, fast data capture and precision clock timing. The bottle neck analyzed in testing of recently high-performance ADCs is the linear signal generation, as the present need of technologies on timing and data capture can handle the testing need of upcoming ADCs. For current high-resolution ADCs, time for full-code INL and DNL test, which is directly related with the cost, is comparative long because of the large number of variables to be accurately measured.

Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.

This complete update of a classic handbook originally created by Analog Devices and never previously published offers the most complete and up-to-date reference available on data conversion, from the world authority on the subject. It describes in depth the theory behind and the practical design of data conversion circuits. It describes the different architectures used in A/D and D/A converters - including many advances that have been made in this technology in recent years - and provides guidelines on which types are best suited for particular applications. It covers error characterization and testing specifications, essential design information that is difficult to find elsewhere. The book also contains a wealth of practical application circuits for interfacing and supporting A/D and D/A converters within an electronic system. In short, everything an electronics engineer needs to know about data converters can be found in this volume, making it an indispensable reference with broad appeal. The accompanying CD-ROM provides software tools for testing and analyzing data converters as well as a searchable pdf version of the text. * brings together a huge amount of information impossible to locate elsewhere. * many recent advances in converter technology simply aren't covered in any other book. * a must-have design reference for any electronics design engineer or technician

Pipelined ADCs have seen phenomenal improvements in performance over the last few years. As such, when designing a pipelined ADC a clear understanding of the design tradeoffs, and state of the art techniques is required to implement today's high performance low power ADCs.

With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. This has recently generated a great demand for low-power, low-voltage A/D converters that can be realized in a mainstream deep-submicron CMOS technology. However, the discrepancies between lithography wavelengths and circuit feature sizes are increasing. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. The inherent randomness of materials used in fabrication at nanoscopic scales means that performance will be increasingly variable, not only from die-to-die but also within each individual die. Parametric variability will be compounded by degradation in nanoscale integrated circuits resulting in instability of parameters over time, eventually leading to the development of faults. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods. In an attempt to address these issues, Low-Power High-Resolution Analog-to-Digital Converters specifically focus on: i) improving the power efficiency for the high-speed, and low spurious spectral A/D conversion performance by exploring the potential of low-voltage analog design and calibration techniques, respectively, and ii) development of circuit techniques and algorithms to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover errors continuously. The feasibility of the described methods has been verified by measurements from the silicon prototypes fabricated in standard 180nm, 90nm and 65nm CMOS technology.

This book presents the a scientific discussion of the state-of-the-art techniques and designs for modeling, testing and for the performance analysis of data converters. The focus is put on sustainable data conversion. Sustainability has become a public issue that industries and users can not ignore. Devising environmentally friendly solutions for data conversion designing, modeling and testing is nowadays a requirement that researchers and practitioners must consider in their activities. This book presents the outcome of the IWADC workshop 2011, held in Orvieto, Italy.

More and more chips are being designed with both analog and digital circuitry next to each other, which makes testing analog circuitry even more challenging. This comprehensive guide reviews all the potential testing options, helping designers, engineers, CAD developers, and researchers choose the most cost-effective, accurate solutions for both mixed-signal and analog-only testing.