This book constitutes the proceedings of the 14th European Conference on Modelling Foundations and Applications, ECMFA 2018, held as part of STAF 2018, in Toulouse, France, in June 2018. The 19 papers presented in this volume were carefully reviewed and selected from 45 submissions. The cover topics such as (bidirectional and unidirectional) model transformations, model management, re-engineering, modelling environments, verification and validation, and domain-specific modelling w.r.t. business processes, automotive software, and safety-critical software.

Results of measurements and conclusions derived from them constitute much of the technical information produced by the National Institute of Standards and Technology (NIST). In July 1992 the Director of NIST appointed an Ad Hoc Committee on Uncertainty Statements and charged it with recommending a policy on this important topic. The Committee concluded that the CIPM approach could be used to provide quantitative expression of measurement that would satisfy NIST¿s customers¿ requirements. NIST initially published a Technical Note on this issue in Jan. 1993. This 1994 edition addresses the most important questions raised by recipients concerning some of the points it addressed and some it did not. Illustrations.

It is now widely recognized that measurement data should be properly analyzed to include an assessment of their associated uncertainty. Since this parameter allows for a meaningful comparison of the measurement results and for an evaluation of their reliability, its expression is important not only in the specialized field of scientific metrology, but also in industry, trade, and commerce. General rules for evaluating and expressing the uncertainty are given in the internationally accepted ISO Guide to the Expression of Uncertainty in Measurement, generally known as the GUM. Evaluating the Measurement Uncertainty details the theoretical framework on which the GUM is based and provides additional material on more advanced topics such as least-squares adjustment and Bayesian statistics. The book does not require previous knowledge other than elementary calculus and can be read as a complement to the GUM or as a stand-alone reference source. It stresses fundamental principles and illustrates their applications through numerous examples taken from many different fields of metrology. The book includes practical guidance as well as theoretical aspects, resulting in an invaluable resource for metrologists, engineers, physicists, and graduate students involved with measurements in academia and industry.

The expression of uncertainty in measurement poses a challenge since it involves physical, mathematical, and philosophical issues. This problem is intensified by the limitations of the probabilistic approach used by the current standard (the GUM Instrumentation Standard). This text presents an alternative approach. It makes full use of the mathematical theory of evidence to express the uncertainty in measurements. Coverage provides an overview of the current standard, then pinpoints and constructively resolves its limitations. Numerous examples throughout help explain the book’s unique approach.

"This introduction to measurement uncertainty is intended for metrology professionals working in calibration laboratories and metrology institutes, as well as students in tertiary-level science and engineering programmes. The subject matter is presented with an emphasis on developing models of the physical measurement process. The level of mathematics and statistics used is basic and is typically covered by high school studies"--Distributor's website.

This book provide a comprehensive set of modeling methods for data and uncertainty analysis, taking readers beyond mainstream methods and focusing on techniques with a broad range of real-world applications. The book will be useful as a textbook for graduate students, or as a training manual in the fields of calibration and testing. The work may also serve as a reference for metrologists, mathematicians, statisticians, software engineers, chemists, and other practitioners with a general interest in measurement science.