30th European Symposium on Computer Aided Chemical Engineering, Volume 47 contains the papers presented at the 30th European Symposium of Computer Aided Process Engineering (ESCAPE) event held in Milan, Italy, May 24-27, 2020. It is a valuable resource for chemical engineers, chemical process engineers, researchers in industry and academia, students, and consultants for chemical industries. - Presents findings and discussions from the 30th European Symposium of Computer Aided Process Engineering (ESCAPE) event - Offers a valuable resource for chemical engineers, chemical process engineers, researchers in industry and academia, students, and consultants for chemical industries

32nd European Symposium on Computer Aided Process Engineering: ESCAPE-32 contains the papers presented at the 32nd European Symposium of Computer Aided Process Engineering (ESCAPE) event held in Toulouse, France. It is a valuable resource for chemical engineers, chemical process engineers, researchers in industry and academia, students and consultants for chemical industries who work in process development and design. - Presents findings and discussions from the 32nd European Symposium of Computer Aided Process Engineering (ESCAPE) event

The 31st European Symposium on Computer Aided Process Engineering: ESCAPE-31, Volume 50 contains the papers presented at the 31st European Symposium of Computer Aided Process Engineering (ESCAPE) event held in Istanbul, Turkey. It is a valuable resource for chemical engineers, chemical process engineers, researchers in industry and academia, students and consultants in the chemical industries. - Presents findings and discussions from the 31st European Symposium of Computer Aided Process Engineering (ESCAPE) event

27th European Symposium on Computer Aided Process Engineering, Volume 40 contains the papers presented at the 27th European Society of Computer-Aided Process Engineering (ESCAPE) event held in Barcelona, October 1-5, 2017. It is a valuable resource for chemical engineers, chemical process engineers, researchers in industry and academia, students, and consultants for chemical industries. - Presents findings and discussions from the 27th European Society of Computer-Aided Process Engineering (ESCAPE) event

26th European Symposium on Computer Aided Process Engineering contains the papers presented at the 26th European Society of Computer-Aided Process Engineering (ESCAPE) Event held at Portorož Slovenia, from June 12th to June 15th, 2016. Themes discussed at the conference include Process-product Synthesis, Design and Integration, Modelling, Numerical analysis, Simulation and Optimization, Process Operations and Control and Education in CAPE/PSE. Presents findings and discussions from the 26th European Society of Computer-Aided Process Engineering (ESCAPE) Event

Early and accurate fault detection and diagnosis for modern chemical plants can minimise downtime, increase the safety of plant operations, and reduce manufacturing costs. The process-monitoring techniques that have been most effective in practice are based on models constructed almost entirely from process data. The goal of the book is to present the theoretical background and practical techniques for data-driven process monitoring. Process-monitoring techniques presented include: Principal component analysis; Fisher discriminant analysis; Partial least squares; Canonical variate analysis. The text demonstrates the application of all of the data-driven process monitoring techniques to the Tennessee Eastman plant simulator - demonstrating the strengths and weaknesses of each approach in detail. This aids the reader in selecting the right method for his process application. Plant simulator and homework problems in which students apply the process-monitoring techniques to a nontrivial simulated process, and can compare their performance with that obtained in the case studies in the text are included. A number of additional homework problems encourage the reader to implement and obtain a deeper understanding of the techniques. The reader will obtain a background in data-driven techniques for fault detection and diagnosis, including the ability to implement the techniques and to know how to select the right technique for a particular application.