1995 IEEE International Test Conference
Title | 1995 IEEE International Test Conference PDF eBook |
Author | |
Publisher | |
Pages | 1011 |
Release | 1995 |
Genre | Electronic digital computers |
ISBN | 9780780329928 |
Proceedings, International Test Conference 1995
Title | Proceedings, International Test Conference 1995 PDF eBook |
Author | |
Publisher | Conference |
Pages | 1032 |
Release | 1995 |
Genre | Automatic test equipment |
ISBN |
Proceedings International Test Conference 1995
Title | Proceedings International Test Conference 1995 PDF eBook |
Author | |
Publisher | |
Pages | 0 |
Release | 1995 |
Genre | |
ISBN | 9780780329911 |
Proceedings, International Test Conference 1997
Title | Proceedings, International Test Conference 1997 PDF eBook |
Author | |
Publisher | |
Pages | 1074 |
Release | 1997 |
Genre | Automatic test equipment |
ISBN |
The European Design and Test Conference: ED and TC 1995: Proceedings of the European Design and Test Conference (1995: Paris, France
Title | The European Design and Test Conference: ED and TC 1995: Proceedings of the European Design and Test Conference (1995: Paris, France PDF eBook |
Author | |
Publisher | |
Pages | |
Release | 1995 |
Genre | |
ISBN |
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Title | Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits PDF eBook |
Author | Sandeep K. Goel |
Publisher | CRC Press |
Pages | 259 |
Release | 2017-12-19 |
Genre | Technology & Engineering |
ISBN | 143982942X |
Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay defects (SDDs), which can cause immediate timing failures on both critical and non-critical paths in the circuit. Overviews semiconductor industry test challenges and the need for SDD testing, including basic concepts and introductory material Describes algorithmic solutions incorporated in commercial tools from Mentor Graphics Reviews SDD testing based on "alternative methods" that explores new metrics, top-off ATPG, and circuit topology-based solutions Highlights the advantages and disadvantages of a diverse set of metrics, and identifies scope for improvement Written from the triple viewpoint of university researchers, EDA tool developers, and chip designers and tool users, this book is the first of its kind to address all aspects of SDD testing from such a diverse perspective. The book is designed as a one-stop reference for current industrial practices, research challenges in the domain of SDD testing, and recent developments in SDD solutions.
Introduction to IDDQ Testing
Title | Introduction to IDDQ Testing PDF eBook |
Author | S. Chakravarty |
Publisher | Springer Science & Business Media |
Pages | 336 |
Release | 2012-12-06 |
Genre | Technology & Engineering |
ISBN | 146156137X |
Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.