Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Title | Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits PDF eBook |
Author | |
Publisher | |
Pages | 309 |
Release | 2007 |
Genre | Electronic book |
ISBN | 9781509085309 |
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Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Title | Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits PDF eBook |
Author | Souvik Mahapatra |
Publisher | IEEE Computer Society Press |
Pages | 309 |
Release | 2007-01-01 |
Genre | Technology & Engineering |
ISBN | 9781424410149 |
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Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2007
Title | Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2007 PDF eBook |
Author | Souvik Mahapatra |
Publisher | |
Pages | 309 |
Release | 2007 |
Genre | Integrated circuits |
ISBN | 9781424410156 |
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14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2007
Title | 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2007 PDF eBook |
Author | |
Publisher | |
Pages | 0 |
Release | 2007 |
Genre | Integrated circuits |
ISBN | 9781424410156 |
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Physical and Failure Analysis of Integrated Circuits
Title | Physical and Failure Analysis of Integrated Circuits PDF eBook |
Author | IEEE Singapore Section |
Publisher | |
Pages | |
Release | 1987 |
Genre | |
ISBN |
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Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Title | Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits PDF eBook |
Author | |
Publisher | |
Pages | |
Release | 2002 |
Genre | |
ISBN |
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ISTFA 2009
Title | ISTFA 2009 PDF eBook |
Author | |
Publisher | ASM International |
Pages | 371 |
Release | 2009-01-01 |
Genre | Technology & Engineering |
ISBN | 1615030921 |
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This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.