X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.

This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.

Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.

The book is best used in the following sequence. (1) The radiation and method of recording are selected in accordance with the data of Chapters 1 and 2; the detailed param eters for the recording are defined. (2) The patterns are indexed with the assistance of the graphs and tables of Chapter 3. (3) The measured intensities are compared with the values found from the tables of Chapter 4. (4) The particular problem at hand (determi nation of stresses, phase analysis, and so on) is solved with the aid of the tables and nomo grams given in the second part of the book. The nomograms can be enlarged for use if necessary. This is not the only mode of use; in particular, the material in the appropriate chapter may be sufficient for a particular type of routine analysis. I have had the benefit of valuable advice from workers in various laboratories (Moscow State University, Moscow Steel Institute, the Institute of Crystallography, the Central Research Institute for Ferrous Metallurgy, the Technological Research Institute of the Automobile Industry, the Karpov Institute of Physical Chemistry, the All-Union Hard Alloys K~search Institute, and so on). In addition, I am deeply indebted for much assistance to Professor Ya. S. Umanskii (scientific editor), Professor V. I. Iveronova, Professor A. I. Kitaigorodskii, G. A. Gol'der, and V. I. Rydnik. I recognize that this work cannot be free from deficiencies, and I should like to thank in advance workers in x-ray laboratories who may offer criticisms.

X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.

A clear-cut introduction to the technique and applications of x-ray absorption spectroscopy X-ray Absorption Spectroscopy is being applied to a widening set of disciplines. Applications started with solid state physics and grew to materials science, chemistry, biochemistry and geology. Now, they cut across engineering materials, environmental science and national heritage — providing very detailed and useful information facilitating understanding and development of materials. This practical guide helps investigators choose the right experiment, carry it out properly and analyze the data to give the best reliable result. It gives readers insights to extract what they need from the world of large-scale experimental facilities like synchrotrons, which seem distant to many laboratory scientists. X-ray Absorption Spectroscopy for the Chemical and Materials Sciences seeks to educate readers about the strengths and limitations of the techniques, including their accessibility. Presented in six sections, it offers chapters that cover: an introduction to X-ray absorption fine structure XAFS; the basis of XAFS; X-ray sources; experimental methods; data analysis and simulation methods; and case studies. A no-nonsense introduction to the technique and applications of x-ray absorption spectroscopy Features Questions to support learning through the book Relevant to all working on synchrotron sources and applications in physics, materials, environment/geology and biomedical materials Four-color representation allows easy interpretation of images and data for the reader X-ray Absorption Spectroscopy for the Chemical and Materials Sciences is aimed at Masters-level and PhD students embarking on X-ray spectroscopy projects as well as scientists in areas of materials characterization.

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.