This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.

"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--

Written by the inventors and leading experts of this new field, the book results from the International Symposium on “Atomic Switch: Invention, Practical use and Future Prospects” which took place in Tsukuba, Japan on March 27th - 28th, 2017. The book chapters cover the different trends from the science and technology of atomic switches to their applications like brain-type information processing, artificial intelligence (AI) and completely novel functional electronic nanodevices. The current practical uses of the atomic switch are also described. As compared with the conventional semiconductor transistor switch, the atomic switch is more compact (~1/10) with much lower power consumption (~1/10) and scarcely influenced by strong electromagnetic noise and radiation including cosmic rays in space (~1/100). As such, this book is of interest to researchers, scholars and students willing to explore new materials, to refine the nanofabrication methods and to explore new and efficient device architectures.

This book constitutes the proceedings of the 23rd International Conference on Verification, Model Checking, and Abstract Interpretation, VMCAI 2022, which took place in Philadelphia, PA, USA, in January 2022. The 22 papers presented in this volume were carefully reviewed from 48 submissions. VMCAI provides a forum for researchers working on verification, model checking, and abstract interpretation and facilitates interaction, cross-fertilization, and advancement of hybrid methods that combine these and related areas.

Technology in today’s world has continued to develop into multifaceted structures. The performance of computers, specifically, has significantly increased leading to various and complex problems regarding the dependability of these systems. Recently, solutions for these issues have been based on soft computing methods; however, there lacks a considerable amount of research on the applications of these techniques within system dependability. Soft Computing Methods for System Dependability is a collection of innovative research on the applications of these processing techniques for solving problems within the dependability of computer system performance. This book will feature comparative experiences shared by researchers regarding the development of these technological solutions. While highlighting topics including evolutionary computing, chaos theory, and artificial neural networks, this book is ideally designed for researchers, data scientists, computing engineers, industrialists, students, and academicians in the field of computer science.

This book describes how to achieve dependability in information systems. The author first proposes viewing systems as open systems instead of closed systems and presents Open Systems Dependability as a property for a system that has the ability to provide optimal services, minimize damage when stoppages occur, resume services quickly, and achieve a

This book constitutes the refereed proceedings of the Second European Dependable Computing Conference, EDCC-2, held in Taormina, Italy, in October 1996. The book presents 26 revised full papers selected from a total of 66 submissions based on the reviews of 146 referees. The papers are organized in sections on distributed fault tolerance, fault injection, modelling and evaluation, fault-tolerant design, basic hardware models, testing, verification, replication and distribution, and system level diagnosis.