Electron energy loss spectrometry is a key analytical technique used to analyze a variety of materials and chemicals including ceramics, metals, polymers, minerals, semiconductors, and magnetic materials. This book serves as a reference on EELS with the transmission electron microscope. The new Second Edition includes a CD-ROM that provides a compendium of experimental spectra.

Electron Energy Loss Spectroscopy (EELS) is a high resolution technique used for the analysis of thin samples of material. The technique is used in many modern transmission electron microscopes to characterise materials. This book provides an up-to-date introduction to the principles and applications of EELS. Specific topics covered include, theory of EELS, elemental quantification, EELS fine structure, EELS imaging and advanced techniques.

A comprehensive guide to a technique for the chemical and structural analysis of thin specimens in a transmission electron microscope. About a third of the text has been rewritten from the 1986 first edition to reflect the substantial developments in methods, instruments, applications, and interpret

This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment.