This book/CD package provides a reference on electron energy loss spectrometry (EELS) with the transmission electron microscope, an established technique for chemical and structural analysis of thin specimens in a transmission electron microscope. Describing the issues of instrumentation, data acquisition, and data analysis, the authors apply this technique to several classes of materials, namely ceramics, metals, polymers, minerals, semiconductors, and magnetic materials. The accompanying CD-ROM consists of a compendium of experimental spectra.

This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, the book provides the necessary instructions for successful hands-on application of this versatile materials characterization technique.

This volume of conference proceedings characterizes the microstructure of materials ranging from polymers to superconductors. Electron energy loss spectrometry is a recent addition to the group of diffraction, imaging and spectroscopic techniques available for the study of materials by transmission electron microscope. The book is intended for the use of materials scientists who are looking for a combination of analytical tools and problem-solving approaches.

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Spectroscopic Methods in Mineralogy and Material Science covers significant advances in the technological aspects and applications of spectroscopic and microscopic techniques used in the Earth and Materials Sciences. The current volume compliments the now classic Volume 18, Spectroscopic Methods in Mineralogy and Geology, which became an essential resource to many scientists and educators for the past two decades. This volume updates techniques covered in Volume 18, and introduces new techniques available for probing the secrets of Earth materials, such as X-ray Raman and Brillouin spectroscopy. Other important topics including Transmission Electron Microscopy (TEM) and Atomic Force Microscopy (AFM) are also covered.

Electron Energy Loss Spectroscopy (EELS) is a high resolution technique used for the analysis of thin samples of material. The technique is used in many modern transmission electron microscopes to characterise materials. This book provides an up-to-date introduction to the principles and applications of EELS. Specific topics covered include, theory of EELS, elemental quantification, EELS fine structure, EELS imaging and advanced techniques.

Christian Rockenhäuser adresses phase formation and cation interdiffusion of the GdxCe1-xO2-x/2-and SmxCe1-xO2-x/2-material systems at temperatures ranging from 970 to 1270°C. Diffusion couples with CeO2/Sm2O3 and CeO2/Gd2O3 interfaces were fabricated for the investigations. The resulting reaction phases were investigated utilizing transmission electron microscopy (TEM) and allow conclusions regarding the phase diagrams in the examined temperature range. A miscibility gap can be ruled out for GdxCe1-xO2-x/2 across the whole composition range. Cation interdiffusion coefficients were determined for both material systems by measuring and evaluating concentration profiles at the material interfaces. The activation enthalpies for interdiffusion were calculated using the temperature dependence of the interdiffusion coefficients. The study for the first time compiles comprehensively the previous results regarding the phase diagrams of the two material systems since 1923.