Explores the uses of TXRF in micro- and trace analysis, and in surface- and near-surface-layer analysis • Pinpoints new applications of TRXF in different fields of biology, biomonitoring, material and life sciences, medicine, toxicology, forensics, art history, and archaeometry • Updated and detailed sections on sample preparation taking into account nano- and picoliter techniques • Offers helpful tips on performing analyses, including sample preparations, and spectra recording and interpretation • Includes some 700 references for further study

X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.

Using only a minimum of mathematics, the author focuses on practical applications of TXRF in a variety of disciplines, including geology, biology, material and environmental sciences, medicine, forensics, and art history.

X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF. Those recent technological advances, including the design of low-power micro- focus tubes and novel X-ray optics and detectors, have made it possible to extend XRF to the analysis of low-Z elements and to obtain 2D or 3D information on a micrometer-scale. And, the recent development and commercialization of bench top and portable instrumentation, offering extreme simplicity of operation in a low-cost design, have extended the applications of XRF to many more analytical problems.

A Practical Guide to Total Reflection X-ray Fluorescence discusses how a wide range of samples can be analyzed using Total Reflection X-ray Fluorescence (TXRF) to obtain meaningful and accurate results. Sample handling is a complex problem and often very targeted approaches are needed. The strengths and weaknesses of the method are discussed in the context of each application in this book. This includes guidelines and suggestions of how to treat and analyze different samples and how to evaluate the data. In addition to sample handling, users of TXRF will learn how to use and calibrate the instrumentation, what specific features are present and which experimental parameters need to be considered, and how to evaluate the data.The book is divided into two parts. with the first part describing the theoretical aspects of the method and the second part being solely dedicated to its applications. The book emphasizes a practical approach to the method, including advantages and also limitations. The primary concept throughout the book is the chemical measurement process and how it applies to TXRF analysis. The concept is introduced in the first part of the book describing its main aspects like samples, sample handling, and quantification. In the second part of the book the topic is applied to the different application fields of TXRF, presented as separated chapters. Key case studies emphasizing the strength of the method are included in each of the chapters. The book also explains in detail the calibration of the instrument and method, experimental parameters to apply, quantification procedures, and spectra evaluation.This book serves as a valuable resource for users and users-to-be in the field of elemental and trace analysis. All co-authors offer extensive experience in the field of TXRF and can guide users through the chemical measurement process of a specific field of application including what elements are most suitable, and what issues may occur.