The book focuses to foster new and original research ideas and results in three broad areas: computing, analytics, and networking with its prospective applications in the various interdisciplinary domains of engineering. This is an exciting and emerging interdisciplinary area in which a wide range of theory and methodologies are being investigated and developed to tackle complex and challenging real world problems. It also provides insights into the International Conference on Computing Analytics and Networking (ICCAN 2017) which is a premier international open forum for scientists, researchers and technocrats in academia as well as in industries from different parts of the world to present, interact, and exchange the state of art of concepts, prototypes, innovative research ideas in several diversified fields. The book includes invited keynote papers and paper presentations from both academia and industry to initiate and ignite our young minds in the meadow of momentous research and thereby enrich their existing knowledge. The book aims at postgraduate students and researchers working in the discipline of Computer Science & Engineering. It will be also useful for the researchers working in the domain of electronics as it contains some hardware technologies and forthcoming communication technologies.

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

The 1st volume of 'Advances in Microelectronics: Reviews' Book Series contains 19 chapters written by 72 authors from academia and industry from 16 countries. With unique combination of information in each volume, the 'Advances in Microelectronics: Reviews' Book Series will be of value for scientists and engineers in industry and at universities. In order to offer a fast and easy reading of the state of the art of each topic, every chapter in this book is independent and self-contained. All chapters have the same structure: first an introduction to specific topic under study; second particular field description including sensing applications. Each of chapter is ending by well selected list of references with books, journals, conference proceedings and web sites. This book ensures that readers will stay at the cutting edge of the field and get the right and effective start point and road map for the further researches and developments.

This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

This volume contains 60 papers presented at ICTIS 2015: International Conference on Information and Communication Technology for Intelligent Systems. The conference was held during 28th and 29th November, 2015, Ahmedabad, India and organized communally by Venus International College of Technology, Association of Computer Machinery, Ahmedabad Chapter and Supported by Computer Society of India Division IV – Communication and Division V – Education and Research. This volume contains papers mainly focused on ICT and its application for Intelligent Computing, Cloud Storage, Data Mining, Image Processing and Software Analysis etc.

This book is a comprehensive collection of extended contributions from the Workshops on Computational Optimization 2019. Our everyday life is unthinkable without optimization. We try to minimize our effort and to maximize the achieved profit. Many real-world and industrial problems arising in engineering, economics, medicine and other domains can be formulated as optimization tasks. This book presents recent advances in computational optimization. The book includes important real problems like modeling of physical processes, wildfire and flood risk modeling, workforce planning, parameter settings for controlling different processes, optimal electrical vehicle modeling, bioreactor modeling and design of VLSI. It shows how to develop algorithms for them based on new intelligent methods like evolutionary computations, ant colony optimization, constrain programming and others. This research demonstrates how some real-world problems arising in engineering, economics and other domains can be formulated as optimization problems.