Written by an award-winning leader in the field, this is a thoroughly integrated overview of the many facets and disciplines of optical scanning. Of particular utility to both practitioner and student are such features as: An overview of the technology and unifying principles, including active and passive scanning, optical transfer, and system architecture In-depth chapters on scanning theory and processes, scanned resolution, scanner devices and techniques, and the control of scanner beam misplacemen A comprehensive review of the government-sponsored research of agile beam steering, now primed for commercial adaptation A unique focus on the Lagrange invariant and its revealing resolution invariant

The first three chapters cover gaussian beam characteristics, system lens design, and image quality, forming a framework that clarifies and serves the scanning process. Subsequent chapters cover the physical scanning methods holographic, polygonal, galvanometric, resonant, acoustooptic, electrooptic

Optical Scanning Holography is an exciting new field with many potential novel applications. This book contains tutorials, research materials, as well as new ideas and insights that will be useful for those working in the field of optics and holography. The book has been written by one of the leading researchers in the field. It covers the basic principles of the topic which will make the book relevant for years to come.

From its initial publication titled Laser Beam Scanning in 1985 to Handbook of Optical and Laser Scanning, now in its second edition, this reference has kept professionals and students at the forefront of optical scanning technology. Carefully and meticulously updated in each iteration, the book continues to be the most comprehensive scanning resource on the market. It examines the breadth and depth of subtopics in the field from a variety of perspectives. The Second Edition covers: Technologies such as piezoelectric devices Applications of laser scanning such as Ladar (laser radar) Underwater scanning and laser scanning in CTP As laser costs come down, and power and availability increase, the potential applications for laser scanning continue to increase. Bringing together the knowledge and experience of 26 authors from England, Japan and the United States, the book provides an excellent resource for understanding the principles of laser scanning. It illustrates the significance of scanning in society today and would help the user get started in developing system concepts using scanning. It can be used as an introduction to the field and as a reference for persons involved in any aspect of optical and laser beam scanning.

The Handbook of Optical and Laser Scanning reveals the fundamentals of controlling light beam deflection, factors in image fidelity and quality, and the newest technological developments currently impacting scanner system design and applications. This highly practical reference features a logical chapter organization, authoritative yet accessible writing, and hundreds of supporting illustrations. Contributions from 27 subject specialists from the United States, Europe, and Asia afford a valuable range of perspectives as well as global coverage of optical and laser beam scanning. With more than 550 works cited, this Handbook is essential for optical engineers, technologists, scientists, and undergraduate and graduate students in these disciplines. About the Editor: GERALD F. MARSHALL is a Consultant in Optical Design and Engineering, Niles, Michigan. Specializing in optical scanning and display systems, his extensive experience includes senior positions with Kaiser Electronics, San Jose, California; Energy Conversion Devices, Troy, Michigan; Axsys Technologies (formerly Speedring Systems), Rochester Hills, Michigan; and Medical Lasers, Burlington, Massachusetts. Previously he was engaged as a Senior R&D Engineer for airborne navigational display systems at Ferranti Ltd., Edinburgh, Scotland, and as a Physicist with Morganite International Ltd., London, England. The author of many papers, he holds a number of patents and is the editor of two internationally recognized reference books, Laser Beam Scanning and Optical Scanning (both titles, Marcel Dekker, Inc.). He is a Fellow of The Institute of Physics, the Optical Society of America, and SPIE-The International Society for Optical Engineering, of which he is a former director. He received the B.Sc. degree from London University, England.

From its initial publication titled Laser Beam Scanning in 1985 to Handbook of Optical and Laser Scanning, now in its second edition, this reference has kept professionals and students at the forefront of optical scanning technology. Carefully and meticulously updated in each iteration, the book continues to be the most comprehensive scanning resource on the market. It examines the breadth and depth of subtopics in the field from a variety of perspectives. The Second Edition covers: Technologies such as piezoelectric devices Applications of laser scanning such as Ladar (laser radar) Underwater scanning and laser scanning in CTP As laser costs come down, and power and availability increase, the potential applications for laser scanning continue to increase. Bringing together the knowledge and experience of 26 authors from England, Japan and the United States, the book provides an excellent resource for understanding the principles of laser scanning. It illustrates the significance of scanning in society today and would help the user get started in developing system concepts using scanning. It can be used as an introduction to the field and as a reference for persons involved in any aspect of optical and laser beam scanning.

This book provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers. The book concentrates mainly on two instruments: the Confocal Scanning Optical Microscope (CSOM), and the Optical Interference Microscope (OIM). A comprehensive discussion of the theory and design of the Near-Field Scanning Optical Microscope (NSOM) is also given. The text discusses the practical aspects of building a confocal scanning optical microscope or optical interference microscope, and the applications of these microscopes to phase imaging, biological imaging, and semiconductor inspection and metrology.A comprehensive theoretical discussion of the depth and transverse resolution is given with emphasis placed on the practical results of the theoretical calculations and how these can be used to help understand the operation of these microscopes. - Provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers - Explains many practical applications of scanning optical and interference microscopy in such diverse fields as biology and semiconductor metrology - Discusses in theoretical terms the origin of the improved depth and transverse resolution of scanning optical and interference microscopes with emphasis on the practical results of the theoretical calculations - Considers the practical aspects of building a confocal scanning or interference microscope and explores some of the design tradeoffs made for microscopes used in various applications - Discusses the theory and design of near-field optical microscopes - Explains phase imaging in the scanning optical and interference microscopes