Structural analysis is becoming increasingly important for the design of novel, advanced engineering materials, components and assemblies. By using the neutrons and synchrotron radiation, information about the micro- and nanostructure of materials can be obtained non-destructively and with high spatial reolution, both in the near-surface region an also in the bulk of samples and components. Besides its coverage of synchrotron and neutron sources, materials and material processes, measuring techniques, and applications, this ready reference both important method types: diffraction and tomography. Following an introduction, a general section leads on to methods, while further sections are devoted to emerging methods an industrial applications. In this way, the text provides new users of large-scale facilities with easy access to an understanding of both the methods and opportunities offered by different sources and instruments.

Besides its coverage of the four important aspects of synchrotron sources, materials and material processes, measuring techniques, and applications, this ready reference presents both important method types: diffraction and tomography. Following an introduction, a general section leads on to methods, while further sections are devoted to emerging methods and industrial applications. In this way, the text provides new users of large-scale facilities with easy access to an understanding of both the methods and opportunities offered by different sources and instruments.

Retaining its proven concept, the second edition of this ready reference specifically addresses the need of materials engineers for reliable, detailed information on modern material characterization methods. As such, it provides a systematic overview of the increasingly important field of characterization of engineering materials with the help of neutrons and synchrotron radiation. The first part introduces readers to the fundamentals of structure-property relationships in materials and the radiation sources suitable for materials characterization. The second part then focuses on such characterization techniques as diffraction and scattering methods, as well as direct imaging and tomography. The third part presents new and emerging methods of materials characterization in the field of 3D characterization techniques like three-dimensional X-ray diffraction microscopy. The fourth and final part is a collection of examples that demonstrate the application of the methods introduced in the first parts to problems in materials science. With thoroughly revised and updated chapters and now containing about 20% new material, this is the must-have, in-depth resource on this highly relevant topic.

- Up-to-date account of the principles and practice of inelastic and spectroscopic methods available at neutron and synchrotron sources - Multi-technique approach set around a central theme, rather than a monograph on one technique - Emphasis on the complementarity of neutron spectroscopy and X-ray spectroscopy which are usually treated in separate books

Inelastic neutron scattering (INS) is a spectroscopic technique in which neutrons are used to probe the dynamics of atoms and molecules in solids and liquids. This book is the first, since the late 1960s, to cover the principles and applications of INS as a vibrational-spectroscopic technique. It provides a hands-on account of the use of INS, concentrating on how neutron vibrational spectroscopy can be employed to obtain chemical information on a range of materials that are of interest to chemists, biologists, materials scientists, surface scientists and catalyst researchers. This is an accessible and comprehensive single-volume primary text and reference source.

While residual stress can be a problem in many industries and lead to early failure of component, it can also be introduced deliberately to improve lifetimes. Knowledge of the residual stress state in a component can be critical for quality control of surface engineering processes or vital to performing an accurate assessment of component life unde

This book provides a comprehensive and up-to-date introduction to the fundamental theory and applications of slow-neutron scattering.