This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.

Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials. • Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides • Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy • Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materials Featuring numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics.

A comprehensive reference on nanoscale materials chemistry—now revised and updated. This extensive text provides twenty-two revised chapters on the preparations, applications, and characterization as well as the environmental and toxicological aspects of nanoscale materials, with an emphasis on the chemistry component. This Second Edition contains core topics including: New synthetic methods for nanomaterials Nanostructured solids Organized two- and three-dimensional nanocrystals Nanotubes, ribbons, and sheets Nanocatalysts, sorbents, and energy applications Unique physical properties of nanomaterials Photochemistry of nanomaterials Biological and environmental aspects of nanomaterials With input from top experts in the field, such as Bruce Dunn, Vicki Grassian, Warren Ford, and Chris Sorensen, among others, Nanoscale Materials in Chemistry presents a balanced survey of different topics in basic nanoparticle science, and includes helpful end-of-chapter questions and answers. Significantly expanded, the Second Edition remains a key text for understanding the fundamentals of nanoscale materials chemistry and a reliable resource for scientists and researchers.

The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.

Learn the basics—and more—of nanoscale computation and communication in this emerging and interdisciplinary field The field of nanoscale computation and communications systems is a thriving and interdisciplinary research area which has made enormous strides in recent years. A working knowledge of nanonetworks, their conceptual foundations, and their applications is an essential tool for the next generation of scientists and network engineers. Nanonetworks: The Future of Communication and Computation offers a thorough, accessible overview of this subject rooted in extensive research and teaching experience. Offering a concise and intelligible introduction to the key paradigms of nanoscale computation and communications, it promises to become a cornerstone of education in these fast-growing areas. Readers will also find: Detailed treatment of topics including network paradigms, machine learning, safety and security Coverage of the history, applications, and important theories of nanonetworks research Examples and use-cases for all formulas and equations Nanonetworks is ideal for advanced undergraduate and graduate students in engineering and science, as well as practicing professionals looking for an introductory book to help them understand the foundations of nanonetwork systems.

Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.