The LNCS series reports State-of-the-art results in computer science research, development, and education, at a high level and in both printed and electronic form. Enjoying tight cooperation with the R&D community, with numerous individuals, as well as with prestigious organizations and societies, LNCS has grown into the most comprehensive computer science research forum available. The scope of LNCS, including its subseries LNAI and LNBI, spans the whole range of computer science and information technology including interdisciplinary topics in a variety of application fields. More recently, several color-cover sublines have been added featuring, beyond a collection of papers, various added-value components In parallel to the printed book, each new volume is published electronically in LNCS Online

While thin film technology has benefited greatly from artificial intelligence (AI) and machine learning (ML) techniques, there is still much to be learned from a full-scale exploration of these technologies in atomic layer deposition (ALD). This book provides in-depth information regarding the application of ML-based modeling techniques in thin film technology as a standalone approach and integrated with the classical simulation and modeling methods. It is the first of its kind to present detailed information regarding approaches in ML-based modeling, optimization, and prediction of the behaviors and characteristics of ALD for improved process quality control and discovery of new materials. As such, this book fills significant knowledge gaps in the existing resources as it provides extensive information on ML and its applications in film thin technology. Offers an in-depth overview of the fundamentals of thin film technology, state-of-the-art computational simulation approaches in ALD, ML techniques, algorithms, applications, and challenges. Establishes the need for and significance of ML applications in ALD while introducing integration approaches for ML techniques with computation simulation approaches. Explores the application of key techniques in ML, such as predictive analysis, classification techniques, feature engineering, image processing capability, and microstructural analysis of deep learning algorithms and generative model benefits in ALD. Helps readers gain a holistic understanding of the exciting applications of ML-based solutions to ALD problems and apply them to real-world issues. Aimed at materials scientists and engineers, this book fills significant knowledge gaps in existing resources as it provides extensive information on ML and its applications in film thin technology. It also opens space for future intensive research and intriguing opportunities for ML-enhanced ALD processes, which scale from academic to industrial applications.

Unveiling the Future: Your Portal to Artificial Intelligence Proficiency In the epoch of digital metamorphosis, Artificial Intelligence (AI) stands as the vanguard of a new dawn, a nexus where human ingenuity intertwines with machine precision. As we delve deeper into this uncharted realm, the boundary between the conceivable and the fantastical continually blurs, heralding a new era of endless possibilities. The Dictionary of Artificial Intelligence, embracing a compendium of 3,300 meticulously curated titles, endeavors to be the torchbearer in this journey of discovery, offering a wellspring of knowledge to both the uninitiated and the adept. Embarking on the pages of this dictionary is akin to embarking on a voyage through the vast and often turbulent seas of AI. Each entry serves as a beacon, illuminating complex terminologies, core principles, and the avant-garde advancements that characterize this dynamic domain. The dictionary is more than a mere compilation of terms; it's a labyrinth of understanding waiting to be traversed. The Dictionary of Artificial Intelligence is an endeavor to demystify the arcane, to foster a shared lexicon that enhances collaboration, innovation, and comprehension across the AI community. It's a mission to bridge the chasm between ignorance and insight, to unravel the intricacies of AI that often seem enigmatic to the outsiders. This profound reference material transcends being a passive repository of terms; it’s an engagement with the multifaceted domain of artificial intelligence. Each title encapsulated within these pages is a testament to the audacity of human curiosity and the unyielding quest for advancement that propels the AI domain forward. The Dictionary of Artificial Intelligence is an invitation to delve deeper, to grapple with the lexicon of a field that stands at the cusp of redefining the very fabric of society. It's a conduit through which the curious become enlightened, the proficient become masters, and the innovators find inspiration. As you traverse through the entries of The Dictionary of Artificial Intelligence, you are embarking on a journey of discovery. A journey that not only augments your understanding but also ignites the spark of curiosity and the drive for innovation that are quintessential in navigating the realms of AI. We beckon you to commence this educational expedition, to explore the breadth and depth of AI lexicon, and to emerge with a boundless understanding and an unyielding resolve to contribute to the ever-evolving narrative of artificial intelligence. Through The Dictionary of Artificial Intelligence, may your quest for knowledge be as boundless and exhilarating as the domain it explores.

With the field of computational statistics growing rapidly, there is a need for capturing the advances and assessing their impact. Advances in simulation and graphical analysis also add to the pace of the statistical analytics field. Computational statistics play a key role in financial applications, particularly risk management and derivative pricing, biological applications including bioinformatics and computational biology, and computer network security applications that touch the lives of people. With high impacting areas such as these, it becomes important to dig deeper into the subject and explore the key areas and their progress in the recent past. Methodologies and Applications of Computational Statistics for Machine Intelligence serves as a guide to the applications of new advances in computational statistics. This text holds an accumulation of the thoughts of multiple experts together, keeping the focus on core computational statistics that apply to all domains. Covering topics including artificial intelligence, deep learning, and trend analysis, this book is an ideal resource for statisticians, computer scientists, mathematicians, lecturers, tutors, researchers, academic and corporate libraries, practitioners, professionals, students, and academicians.

SISDEP ’95 provides an international forum for the presentation of state-of-the-art research and development results in the area of numerical process and device simulation. Continuously shrinking device dimensions, the use of new materials, and advanced processing steps in the manufacturing of semiconductor devices require new and improved software. The trend towards increasing complexity in structures and process technology demands advanced models describing all basic effects and sophisticated two and three dimensional tools for almost arbitrarily designed geometries. The book contains the latest results obtained by scientists from more than 20 countries on process simulation and modeling, simulation of process equipment, device modeling and simulation of novel devices, power semiconductors, and sensors, on device simulation and parameter extraction for circuit models, practical application of simulation, numerical methods, and software.