Microwave Plasma-enhanced Chemical Vapor Deposition and Characterization of Diamond and Silicon Nitride Thin Films

Microwave Plasma-enhanced Chemical Vapor Deposition and Characterization of Diamond and Silicon Nitride Thin Films
Title Microwave Plasma-enhanced Chemical Vapor Deposition and Characterization of Diamond and Silicon Nitride Thin Films PDF eBook
Author Kevin John Grannen
Publisher
Pages
Release 1994
Genre
ISBN

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Characterization of Plasma-Enhanced CVD Processes: Volume 165

Characterization of Plasma-Enhanced CVD Processes: Volume 165
Title Characterization of Plasma-Enhanced CVD Processes: Volume 165 PDF eBook
Author Gerald Lucovsky
Publisher Mrs Proceedings
Pages 280
Release 1990-09-05
Genre Technology & Engineering
ISBN

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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Synthesis and Characterization of Diamond Thin Films by Microwave Plasma-enhanced Chemical Vapor Deposition (MPECVD)

Synthesis and Characterization of Diamond Thin Films by Microwave Plasma-enhanced Chemical Vapor Deposition (MPECVD)
Title Synthesis and Characterization of Diamond Thin Films by Microwave Plasma-enhanced Chemical Vapor Deposition (MPECVD) PDF eBook
Author Shih-Feng Chou
Publisher
Pages 174
Release 2005
Genre
ISBN

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Diamond thin films are deposited on silicon wafers by MPECVD process with the presence of methane, argon, and hydrogen gases. The reaction chamber is designed with an internal microwave reaction cavity and a high-pressure pocket for improving deposition conditions. Scanning electron microscopy reveals tetrahedral and cauliflower-shaped crystals for polycrystalline diamond and nanocrystalline diamond films, respectively. Spectroscopy ellipsometer studies indicate that diamond-like carbon (DLC) films are deposited with a thickness of 700 nm. Fourier transform infrared spectroscopy shows C-H stretching in the range from 2800 cm -1 to 3000 cm -1 . Nanoindentation is performed on DLC films with an average hardness of 10.98 GPa and an average elastic modulus of 90.32 GPa. The effects of chamber pressure, microwave forward power, and gas mixture on the plasma chemistry are discussed. Substrate temperature has a significant influence on film growth rate, and substrate pretreatment can enhance the quality of diamond films.

Microwave Plasma Enhanced Chemical Vapor Deposition and Structural Characterization of Diamond Films

Microwave Plasma Enhanced Chemical Vapor Deposition and Structural Characterization of Diamond Films
Title Microwave Plasma Enhanced Chemical Vapor Deposition and Structural Characterization of Diamond Films PDF eBook
Author Wei Zhu
Publisher
Pages 530
Release 1990
Genre Diamond thin films
ISBN

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Synthesis and Characterization of Silicon Nitride Films Deposited by Plasma Enhanced Chemical Vapor Deposition Using Diethylsilane

Synthesis and Characterization of Silicon Nitride Films Deposited by Plasma Enhanced Chemical Vapor Deposition Using Diethylsilane
Title Synthesis and Characterization of Silicon Nitride Films Deposited by Plasma Enhanced Chemical Vapor Deposition Using Diethylsilane PDF eBook
Author Yanyao Yu
Publisher
Pages 116
Release 1993
Genre Diethysilane
ISBN

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Microwave Enhanced Chemical Vapor Deposition of Silicon Compound Thin Films and Their Characterization

Microwave Enhanced Chemical Vapor Deposition of Silicon Compound Thin Films and Their Characterization
Title Microwave Enhanced Chemical Vapor Deposition of Silicon Compound Thin Films and Their Characterization PDF eBook
Author Madan Gopal
Publisher
Pages 252
Release 1991
Genre Protective coatings
ISBN

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The Growth of Silicon Nitride Crystalline Films Using Microwave Plasma Enhanced Chemical Vapor Deposition

The Growth of Silicon Nitride Crystalline Films Using Microwave Plasma Enhanced Chemical Vapor Deposition
Title The Growth of Silicon Nitride Crystalline Films Using Microwave Plasma Enhanced Chemical Vapor Deposition PDF eBook
Author
Publisher
Pages 31
Release 1994
Genre
ISBN

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Crystalline thin films of silicon nitride have been grown on a variety of substrates by microwave plasma-enhanced chemical vapor deposition using N2, O2, and CH4 gases at a temperature of 800 deg C. X-ray diffraction and Rutherford backscattering measurements indicate the deposits are stoichiometric silicon nitride with varying amounts of the alpha and beta phases. Scanning electron microscope imaging indicates beta-Si3N4 possesses six-fold symmetry with particles size in the submicron range. In one experiment, the silicon necessary for growth comes from the single crystal silicon substrate due to etching/sputtering by the nitrogen plasma. The dependence of the grain size on the methane concentration is investigated. In an another experiment, an organo- silicon source, methoxytrimethylsilane, is used to grow silicon nitride with controlled introduction of the silicon necessary for growth. Thin crystalline films are deposited at rates of 0.1 micrometer/hr as determined by profilometry. A growth mechanism for both cases is proposed.