Comprehensive coverage of all aspects of space application oriented fault tolerance techniques • Experienced expert author working on fault tolerance for Chinese space program for almost three decades • Initiatively provides a systematic texts for the cutting-edge fault tolerance techniques in spacecraft control computer, with emphasis on practical engineering knowledge • Presents fundamental and advanced theories and technologies in a logical and easy-to-understand manner • Beneficial to readers inside and outside the area of space applications

This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.

This book constitutes the refereed proceedings of the 22nd International Conference on Architecture of Computing Systems, ARCS 2009, held in Delft, The Netherlands, in March 2009. The 21 revised full papers presented together with 3 keynote papers were carefully reviewed and selected from 57 submissions. This year's special focus is set on energy awareness. The papers are organized in topical sections on compilation technologies, reconfigurable hardware and applications, massive parallel architectures, organic computing, memory architectures, enery awareness, Java processing, and chip-level multiprocessing.

Space applications, nuclear physics, military operations, medical imaging, and especially electronics (modern silicon processing) are obvious fields in which radiation damage can have serious consequences, i.e., degradation of MOS devices and circuits. Zeroing in on vital aspects of this broad and complex topic, Radiation Effects in Semiconductors addresses the ever-growing need for a clear understanding of radiation effects on semiconductor devices and circuits to combat potential damage it can cause. Features a chapter authored by renowned radiation authority Lawrence T. Clark on Radiation Hardened by Design SRAM Strategies for TID and SEE Mitigation This book analyzes the radiation problem, focusing on the most important aspects required for comprehending the degrading effects observed in semiconductor devices, circuits, and systems when they are irradiated. It explores how radiation interacts with solid materials, providing a detailed analysis of three ways this occurs: Photoelectric effect, Compton effect, and creation of electron-positron pairs. The author explains that the probability of these three effects occurring depends on the energy of the incident photon and the atomic number of the target. The book also discusses the effects that photons can have on matter—in terms of ionization effects and nuclear displacement Written for post-graduate researchers, semiconductor engineers, and nuclear and space engineers with some electronics background, this carefully constructed reference explains how ionizing radiation is creating damage in semiconducting devices and circuits and systems—and how that damage can be avoided in areas such as military/space missions, nuclear applications, plasma damage, and X-ray-based techniques. It features top-notch international experts in industry and academia who address emerging detector technologies, circuit design techniques, new materials, and innovative system approaches.

Annotation A collection of the 78 oral presentations and 24 poster papers from the January 2002 international workshop which brought together specialists from a broad area of electronic design, manufacturing, test, and advanced system applications in the hope that the conference would integrate design, test, and application as "cross- dependent" disciplines. The contributions are organized into sessions focusing on analog test, communications, digital signal processing and architectures, low to high level fault simulation and identification, high level design, memory, power issues in design and test, sensor and analog design, electrical engineering education, electromagnetics and control, fault-tolerant digital systems, image processing, robotics, submicron technology, test generation and compaction, and test techniques and methodologies. Annotation copyrighted by Book News Inc., Portland, OR.

This book presents the theory behind software-implemented hardware fault tolerance, as well as the practical aspects needed to put it to work on real examples. By evaluating accurately the advantages and disadvantages of the already available approaches, the book provides a guide to developers willing to adopt software-implemented hardware fault tolerance in their applications. Moreover, the book identifies open issues for researchers willing to improve the already available techniques.