2006 IEEE International Integrated Reliability Workshop Final Report
Title | 2006 IEEE International Integrated Reliability Workshop Final Report PDF eBook |
Author | |
Publisher | |
Pages | 214 |
Release | 2006 |
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ISBN |
1999 IEEE International Integrated Reliability Workshop Final Report
Title | 1999 IEEE International Integrated Reliability Workshop Final Report PDF eBook |
Author | IEEE Electron Devices Society |
Publisher | IEEE |
Pages | 188 |
Release | 1999 |
Genre | Technology & Engineering |
ISBN | 9780780356498 |
This text constitutes the final report produced from the IEEE International Integrated Reliability Workshop, which took part in 1999.
International Integrated Reliability Workshop Final Report
Title | International Integrated Reliability Workshop Final Report PDF eBook |
Author | |
Publisher | |
Pages | 202 |
Release | 2005 |
Genre | Integrated circuits |
ISBN |
Integrated Reliability Workshop Final Report, 2007 IEEE International
Title | Integrated Reliability Workshop Final Report, 2007 IEEE International PDF eBook |
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Integrated Reliability Workshop Final Report, 1998 IEEE International
Title | Integrated Reliability Workshop Final Report, 1998 IEEE International PDF eBook |
Author | |
Publisher | |
Pages | |
Release | 1998 |
Genre | |
ISBN | 9780780348813 |
Reliability Prediction for Microelectronics
Title | Reliability Prediction for Microelectronics PDF eBook |
Author | Joseph B. Bernstein |
Publisher | John Wiley & Sons |
Pages | 404 |
Release | 2024-02-20 |
Genre | Technology & Engineering |
ISBN | 1394210930 |
RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality & Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the ‘physics of failure’, combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditions Detailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and more New multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.
Final report
Title | Final report PDF eBook |
Author | |
Publisher | |
Pages | 172 |
Release | 1996 |
Genre | |
ISBN | 9780780327054 |