Fundamentals of Surface and Thin Film Analysis
Title | Fundamentals of Surface and Thin Film Analysis PDF eBook |
Author | Leonard C. Feldman |
Publisher | |
Pages | 384 |
Release | 1986 |
Genre | Mathematics |
ISBN |
Contains concise coverage of the major analytical techniques, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, secondary ion mass spectroscopy and RBS methods. Annotation copyrighted by Book News, Inc., Portland, OR
Fundamentals Of Surface And Thin Film Analysis
Title | Fundamentals Of Surface And Thin Film Analysis PDF eBook |
Author | L.C. Feldman |
Publisher | |
Pages | 0 |
Release | |
Genre | |
ISBN |
Solutions Manual to Fundamentals of Surface and Thin Film Analysis
Title | Solutions Manual to Fundamentals of Surface and Thin Film Analysis PDF eBook |
Author | |
Publisher | |
Pages | 43 |
Release | 1987 |
Genre | |
ISBN | 9780444012753 |
Surface and Thin Film Analysis
Title | Surface and Thin Film Analysis PDF eBook |
Author | Henning Bubert |
Publisher | Wiley-VCH |
Pages | 0 |
Release | 2002-05-07 |
Genre | Science |
ISBN | 9783527304585 |
The development and quality assurance of such high-tech materials as semiconductors or biopolymers demand special analytical methods for surfaces and thin films. This book presents the whole spectrum of methods available in a clear manner, moving beyond the basics, equipment and applications to compare these methods. This allows users to find the optimum method in solving any given problem. - The book is richly illustrated with 200 figures - Almost 900 references guide to the primary literature - A list of suppliers, each with full address, makes it easy to obtain the required equipment
Surface and Thin Film Analysis
Title | Surface and Thin Film Analysis PDF eBook |
Author | Gernot Friedbacher |
Publisher | Wiley-VCH |
Pages | 0 |
Release | 2011-06-07 |
Genre | Technology & Engineering |
ISBN | 9783527320479 |
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)
Surface and Thin Film Analysis
Title | Surface and Thin Film Analysis PDF eBook |
Author | Gernot Friedbacher |
Publisher | John Wiley & Sons |
Pages | 514 |
Release | 2011-03-31 |
Genre | Technology & Engineering |
ISBN | 3527636935 |
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)
Fundamentals of Nanoscale Film Analysis
Title | Fundamentals of Nanoscale Film Analysis PDF eBook |
Author | Terry L. Alford |
Publisher | Springer Science & Business Media |
Pages | 349 |
Release | 2007-02-16 |
Genre | Technology & Engineering |
ISBN | 0387292608 |
From materials science to integrated circuit development, much of modern technology is moving from the microscale toward the nanoscale. This book focuses on the fundamental physics underlying innovative techniques for analyzing surfaces and near-surfaces. New analytical techniques have emerged to meet these technological requirements, all based on a few processes that govern the interactions of particles and radiation with matter. This book addresses the fundamentals and application of these processes, from thin films to field effect transistors.