Designed specifically for undergraduate students of Electronics and Electrical Engineering and its related disciplines, this book offers an excellent coverage of all essential topics and provides a solid foundation for analysing electronic circuits. It covers the course named Electronic Devices and Circuits of various universities. The book will also be useful to diploma students, AMIE students, and those pursuing courses in B.Sc. (Electronics) and M.Sc. (Physics). The students are thoroughly introduced to the full spectrum of fundamental topics beginning with the theory of semiconductors and p-n junction behaviour. The devices treated include diodes, transistors—BJTs, JFETs and MOSFETs—and thyristors. The circuitry covered comprises small signal (ac), power amplifiers, oscillators, and operational amplifiers including many important applications of those versatile devices. A separate chapter on IC fabrication technology is provided to give an idea of the technologies being used in this area. There are a variety of solved examples and applications for conceptual understanding. Problems at the end of each chapter are provided to test, reinforce and enhance learning.

A modern and concise treatment of the solid state electronic devices that are fundamental to electronic systems and information technology is provided in this book. The main devices that comprise semiconductor integrated circuits are covered in a clear manner accessible to the wide range of scientific and engineering disciplines that are impacted by this technology. Catering to a wider audience is becoming increasingly important as the field of electronic materials and devices becomes more interdisciplinary, with applications in biology, chemistry and electro-mechanical devices (to name a few) becoming more prevalent. Updated and state-of-the-art advancements are included along with emerging trends in electronic devices and their applications. In addition, an appendix containing the relevant physical background will be included to assist readers from different disciplines and provide a review for those more familiar with the area. Readers of this book can expect to derive a solid foundation for understanding modern electronic devices and also be prepared for future developments and advancements in this far-reaching area of science and technology.

This new text by Denton J. Dailey covers both discrete and integrated components. Among the many features that students will find helpful in understanding the material are the following: Concept icons in the margins signify that topical coverage relates to other fields and areas of electronics, such as communications, microprocessors, and digital electronics. These icons help the reader to answer the question, "Why is it important for me to learn this?" Key terms presented in each chapter are defined in the margins to reinforce students' understanding. Chapter objectives introduce each chapter and provide students with a roadmap of topics to be covered.

This textbook for a one-semester course in Electrical Circuits and Devices is written to be concise, understandable, and applicable. Every new concept is illustrated with numerous examples and figures, in order to facilitate learning. The simple and clear style of presentation is complemented by a spiral and modular approach to the topic. This method supports the learning of those who are new to the field, as well as provides in-depth coverage for those who are more experienced. The author discusses electronic devices using a spiral approach, in which key devices such as diodes and transistors are first covered with simple models that beginning students can easily understand. After the reader has grasped the fundamental concepts, the topics are covered again with greater depth in the latter chapters.

Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites