Go to war or go to jail.For small-time street hustler Cam Alvarez, the choice is simple. He has no family, no friends, no place in the world...nothing to lose. When his latest con results in the death of a cartel hitman, Cam opts to join the Marines and leave Earth to fight a vicious alien enemy. Drafted into the Marine Drop-Troopers, Cam discovers there's one thing he's even better at than running street-con games, and that's killing the enemy. Wrapped in an armored battlesuit, Cam finds purpose amidst the horror and destruction of the war, and the opportunity for a new sort of friends and family...if he can break the habits of a life spent alone, trusting no one. And, if he can survive...Rick Partlow returns with another kickass Military Sci-Fi epic. It's perfect for fans of Jay Allan, Jasper T. Scott, and Scott Bartlett.

The complete uncollected fiction and nonfiction, including the five posthumously discovered “last” stories, published here in book form for the first time—from “one of the great short story writers of our time—of any time” (The Philadelphia Inquirer). Call If You Need Me includes all of the prose previously collected in No Heroics, Please, four essays from Fires, and those five marvelous stories that range over the period of Carver’s mature writing and give his devoted readers a final glimpse of the great writer at work. The pure pleasure of Carver’s writing is everywhere in his work, here no less than in those stories that have already entered the canon of modern literature.

Here for the first time is an account of how each of thirteen historical as well as present-day systems cope with indicating body movement, time, space (direction and level) and other basic movement aspects of paper. A one-to-one comparison is made of how the same simple patterns, such as walking, jumping, turning, etc. are notated in each system.

This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

The sixth edition of Time Out Miami and the Florida Keys is your VIP pass to this A-list city. Time Out's intrepid team of insiders has combed its beaches, bars, restaurants and secret spots to create the definitive guide to the fabulous surreal life of Miami. All rumors of this city being heaven's waiting room will be dispelled as Miami's vibrant, youthful culture is exposed and explored. We will shed light-and not just a neon one on the evolution of what was once a sleepy beach town into one of the world's most glamorous spots.

Friction and the interaction of surfaces can usually be felt at the scale of the contacting bodies. Indeed, phenomena such as the frictional resistance or the occurrence of wear can be observable with plain eye, but to characterize them and in order to make a prediction, a more detailed understanding at smaller scales is often required. These can include individual roughness peaks or single molecule interactions. In this Research Topic, we have gathered a collection of articles representing the state of the art in tribology’s endeavor to bridge the gap between nano scale elementary research and the macroscopic behavior of contacting bodies. These articles showcase the breadth of questions related to the interaction of micro and macro scale and give examples of successful transfer of insights from one to the other. We are delighted to present this Research Topic to the reader with the hope that it will further inspire and stimulate research in the field.