BS ISO 14606. Surface Chemical Analysis. Sputter Depth Profiling. Optimization Using Layered Systems as Reference Materials
Title | BS ISO 14606. Surface Chemical Analysis. Sputter Depth Profiling. Optimization Using Layered Systems as Reference Materials PDF eBook |
Author | British Standards Institution |
Publisher | |
Pages | 24 |
Release | 2022 |
Genre | |
ISBN |
Surface Chemical Analysis. Sputter Depth Profiling. Optimization Using Layered Systems As Reference Materials
Title | Surface Chemical Analysis. Sputter Depth Profiling. Optimization Using Layered Systems As Reference Materials PDF eBook |
Author | British Standards Institute Staff |
Publisher | |
Pages | 24 |
Release | 2001-01-15 |
Genre | |
ISBN | 9780580368530 |
Surface chemistry, Surface properties, Chemical analysis and testing, Depth, Laminates, Profile measurement, Reference conditions, Control samples, Augers, Spectrochemical analysis, Spectroscopy, Electron emission, X-rays, Mass spectrometry, Radiation measurement, Microscopic analysis
Surface chemical analysis : sputter depth profiling : optimization using layered systems as reference materials
Title | Surface chemical analysis : sputter depth profiling : optimization using layered systems as reference materials PDF eBook |
Author | |
Publisher | |
Pages | 0 |
Release | 2000 |
Genre | |
ISBN |
Surface Chemical Analysis. Sputter Depth Profiling. Optimization Using Layered Systems as Reference Materials
Title | Surface Chemical Analysis. Sputter Depth Profiling. Optimization Using Layered Systems as Reference Materials PDF eBook |
Author | British Standards Institution |
Publisher | |
Pages | 0 |
Release | 2023 |
Genre | |
ISBN |
Surface Chemical Analysis
Title | Surface Chemical Analysis PDF eBook |
Author | Standards Australia Limited |
Publisher | |
Pages | 16 |
Release | 2006 |
Genre | Surface chemistry |
ISBN | 9780733777950 |
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
Title | Auger- and X-Ray Photoelectron Spectroscopy in Materials Science PDF eBook |
Author | Siegfried Hofmann |
Publisher | Springer Science & Business Media |
Pages | 545 |
Release | 2012-10-25 |
Genre | Science |
ISBN | 3642273815 |
To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
BS ISO 17109 AMD1. Surface Chemical Analysis. Depth Profiling. Method for Sputter Rate Determination in X-ray Photoelectron Spectroscopy, Auger Electron Spectroscopy and Secondary-ion Mass Spectrometry Sputter Depth Profiling Using Single and Multi-layer Thin Films
Title | BS ISO 17109 AMD1. Surface Chemical Analysis. Depth Profiling. Method for Sputter Rate Determination in X-ray Photoelectron Spectroscopy, Auger Electron Spectroscopy and Secondary-ion Mass Spectrometry Sputter Depth Profiling Using Single and Multi-layer Thin Films PDF eBook |
Author | British Standards Institution |
Publisher | |
Pages | 22 |
Release | 2021 |
Genre | |
ISBN |