NASA SP-7500

NASA SP-7500
Title NASA SP-7500 PDF eBook
Author United States. National Aeronautics and Space Administration
Publisher
Pages 124
Release 1976
Genre
ISBN

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Management

Management
Title Management PDF eBook
Author
Publisher
Pages 260
Release 1975
Genre Industrial engineering
ISBN

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Achieving System Reliability Growth Through Robust Design and Test

Achieving System Reliability Growth Through Robust Design and Test
Title Achieving System Reliability Growth Through Robust Design and Test PDF eBook
Author David Nicholls
Publisher RIAC
Pages 462
Release 2011-06
Genre Technology & Engineering
ISBN 1933904356

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Historically, the reliability growth process has been thought of, and treated as, a reactive approach to growing reliability based on failures "discovered" during testing or, most unfortunately, once a system/product has been delivered to a customer. As a result, many reliability growth models are predicated on starting the reliability growth process at test time "zero", with some initial level of reliability (usually in the context of a time-based measure such as Mean Time Between Failure (MTBF)). Time "zero" represents the start of testing, and the initial reliability of the test item is based on its inherent design. The problem with this approach, still predominant today, is that it ignores opportunities to grow reliability during the design of a system or product, i.e., opportunities to go into reliability growth testing with a higher initial inherent reliability at time zero. In addition to the traditional approaches to reliability growth during test, this book explores the activities and opportunities that can be leveraged to promote and achieve reliability growth during the design phase of the overall system life cycle. The ability to do so as part of an integrated, proactive design environment has significant implications for developing and delivering reliable items quickly, on time and within budget. This book offers new definitions of how failures can be characterized, and how those new definitions can be used to develop metrics that will quantify how effective a Design for Reliability (DFR) process is in (1) identifying failure modes and (2) mitigating their root failure causes. Reliability growth can only occur in the presence of both elements.

Life Cycle Costing

Life Cycle Costing
Title Life Cycle Costing PDF eBook
Author B. S. Dhillon
Publisher Psychology Press
Pages 376
Release 1989
Genre Business & Economics
ISBN 9782881243028

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Evaluating the cost of acquiring major pieces of equipment also necessitates costing their life maintenance. Providing coverage of recent advances in this field, this book covers such topics as reliability improvement warranty, computer hardware/software costing, and reliability engineering.

1980 Proceedings

1980 Proceedings
Title 1980 Proceedings PDF eBook
Author
Publisher
Pages 520
Release 1980
Genre Maintainability (Engineering)
ISBN

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Management, a Continuing Literature Survey with Indexes

Management, a Continuing Literature Survey with Indexes
Title Management, a Continuing Literature Survey with Indexes PDF eBook
Author
Publisher
Pages 750
Release 1975
Genre Industrial engineering
ISBN

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Probabilistic fracture mechanics and reliability

Probabilistic fracture mechanics and reliability
Title Probabilistic fracture mechanics and reliability PDF eBook
Author J.W. Provan
Publisher Springer Science & Business Media
Pages 477
Release 2013-04-17
Genre Science
ISBN 9401727643

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With the advent of the 80's there has been an increasing need for analytic and numerical techniques, based on a thorough understanding of microstructural processes, that express in a manner suitable for practicing engineers the reliability of components and structures that are being subjected to degradation situations. Such situations fall within the framework offracture mechanics, fatigue, corrosion fatigue and pitting corrosion. Luckily, such techniques are now being developed and it was felt timely to combine in one volume reports by the leaders in this field who are currently making great strides towards solving these problems. Hence the idea of this monograph was born and I am pleased to be associated both with it and the contributors whose chapters are included in this volume. A very large part of the credit for this monograph must go to the authors who have taken time out from their busy schedules to prepare their submissions. They have all worked diligently over the last few months in order to get their manuscripts to me on time and I sincerely thank them for their help throughout the preparation of this volume.