Analysis of Step-Stress Models: Existing Results and Some Recent Developments describes, in detail, the step-stress models and related topics that have received significant attention in the last few years. Although two books, Bagdonavicius and Nikulin (2001) and Nelson (1990), on general accelerated life testing models are available, no specific book is available on step-stress models. Due to the importance of this particular topic, Balakrishnan (2009) provided an excellent review for exponential step-stress models. The scope of this book is much more, providing the inferential issues for different probability models, both from the frequentist and Bayesian points-of-view. - Explains the different distributions of the Cumulative Exposure Mode - Covers many different models used for step-stress analysis - Discusses Step-stress life testing under the competing or complementary risk model

This edited collection brings together internationally recognized experts in a range of areas of statistical science to honor the contributions of the distinguished statistician, Barry C. Arnold. A pioneering scholar and professor of statistics at the University of California, Riverside, Dr. Arnold has made exceptional advancements in different areas of probability, statistics, and biostatistics, especially in the areas of distribution theory, order statistics, and statistical inference. As a tribute to his work, this book presents novel developments in the field, as well as practical applications and potential future directions in research and industry. It will be of interest to graduate students and researchers in probability, statistics, and biostatistics, as well as practitioners and technicians in the social sciences, economics, engineering, and medical sciences.

Reveals the powerful and undermining effects of stress on good decision making-and what leaders can do about it The ability to make sound and timely decisions is the mark of a good leader. But when leaders with otherwise strong track records suddenly begin making poor decisions-as seen in the recent corporate scandals that rocked the business world-the impact can be widespread. In The Stress Effect, leadership expert Henry L. Thompson argues that stress is often the real culprit behind this leadership failure: when leaders' stress levels become sufficiently elevated-whether in the boardroom or on the front line of a manufacturing process-their ability to effectively use their emotional intelligence and cognitive ability in tandem to make wise decisions is significantly impaired. Until now, experts have argued that increasing your emotional intelligence will help you cope with and manage stress. This book suggests that stress actually blocks access to your emotional intelligence as well as your cognitive ability, two critical components in the decision-making process. This book Shows how stress adversely affects the performance of even the most savvy leaders Reveals the truth about one of the prime factors behind the current failure of leadership Offers a solid prescription for building a "stress resilient system" and arms leaders with best practices for managing specific stressors that take the biggest toll on decision making Is written by an award-winning organizational psychologist and leadership consultant whose clients include a roster of Fortune 500 companies A groundbreaking and insightful resource for leaders, The Stress Effect reopens the dialogue on stress, its effect on decision making, and what to do about it.

The authors of this monograph have developed a large and important class of survival analysis models that generalize most of the existing models. In a unified, systematic presentation, this monograph fully details those models and explores areas of accelerated life testing usually only touched upon in the literature. Accelerated Life Models:

Methods of risk and reliability analysis are becoming increasingly important as decision support tools in various fields of engineering. Safety, Reliability and Risk Analysis: Beyond the Horizon covers a wide range of topics for which risk analysis forms an indispensable field of knowledge to ensure sufficient safety.

This book contains the fundamentals of a discipline, which could be called Structural Analysis in Microelectronics and Fiber Optics. It deals with mechanical behavior of microelectronic and fiber-optic systems and is written in response to the crucial need for a textbook for a first in-depth course on mechanical problems in microelectronics and fiber optics. The emphasis of this book is on electronic and optical packaging problems, and analytical modeling. This book is apparently the first attempt to select, advance, and present those methods of classical structural mechanics which have been or can be applied in various stress-strain problems encountered in "high technology" engineering and some related areas, such as materials science and solid-state physics. The following major objectives are pursued in Structural Analysis in Microelectronic and Fiber-Optic Systems: Identify structural elements typical for microelectronic and fiber-optic systems and devices, and introduce the student to the basic concepts of the mechanical behavior of microelectronic and fiber-optic struc tures, subjected to thermally induced or external loading. Select, advance, and present methods for analyzing stresses and deflections developed in microelectronic and fiber-optic structures; demonstrate the effectiveness of the methods and approaches of the classical struc tural analysis in the diverse mechanical problems of microelectronics and fiber optics; and give students of engineering, as well as practicing engineers and designers, a thorough understanding of the main princi ples involved in the analytical evaluation of the mechanical behavior of microelectronic and fiber-optic systems.

Reliability Theory and Models: Stochastic Failure Models, Optimal Maintenance Policies, Life Testing, and Structures contains the proceedings of a Symposium on Stochastic Failure Models, Replacement and Maintenance Policies, and Accelerated Life Testing, held in Charlotte, North Carolina, on June 24-26, 1983. Contributors discuss the directions for research on stochastic failure models and maintenance and replacement policies, as well as statistical and computational aspects of reliability. This text is divided into five sections and is comprised of 17 chapters; the first of which introduces the reader to Markov and semi-Markov models of deterioration in light of the results on representation and characterization of Markov processes. The discussion then turns to the concept of minimal repair; situations in which the appropriate stochastic process is a damage or wear process; and optimum policies for several maintenance models based on the imperfect repair model of Brown and Proschan. The chapters that follow explore optimal replacement for self-repairing shock models; the implementation of an iterative scheme for certain Markovian wear/damage models; and a Markov decision model for determining the optimal inventories of repairable spare parts for redundant systems. This book also considers the reliability and maintenance of very large complex systems from the perspective of the U.S. Air Force. This reference material will be of interest to students and active researchers in the fields of mathematics and engineering.