A recording apparatus suitable for thermal and differential thermal analysis was developed. It can be used to obtain data for phase diagram investigations on small samples of rare metals and their alloys at temperatures up to 1500 C. The thermal analysis apparatus consists of a platinum wound resistance furnace with protective atmos phere provisions and a Pt/Pt 13% Rh thermo couple as sensor which feeds a one mV strip chart recorder. A bucking potentiometer used in series with the thermocouple permits a temperature reso lution of better than 0.5 C. For differential thermal analysis, an additional 100 microvolt strip chart recorder is used. The heating or cooling rate can be varied between 0.5 C/min and approximately 15 C/minute. The thermal analysis apparatus was calibrated at several fixed points and has an overall accuracy of =1.5 C. (Author).

A recording apparatus suitable for thermal and differential thermal analysis was developed. It can be used to obtain data for phase diagram in vestigations on small samples of rare metals and their alloys at temperatures up to 1500 C. The thermal analysis apparatus consists of a platinum wound resistance furnace with protective atmos phere provisions and a Pt/Pt 13% Rh thermo couple as sensor which feeds a one mV strip chart recorder. A bucking potentiometer used in series with the thermocouple permits a temperature reso lution of better than 0.5 C. For differential thermal analysis, an additional 100 microvolt strip chart recorder is used. The heating or cooling rate can be varied between 0.5 C/min and approximately 15 C/minute. The thermal analysis apparatus was calibrated at several fixed points and has an overall accuracy of =1.5 C. (Author).

This invention relates to a method of thermal analysis and apparatus therefor which include the steps of controlling the temperatures of at least 2 units to correspond to a predetermined temperature programme and of measuring the power required by each unit to cause its temperature to correspond to the programme. A reference sample and a test sample are heated under identical conditions and the test sample observed for chemical and physical changes during heating. Various temperature differences between the test and reference samples may occur due to exothermic or endothermic reactions taking place in the test sample. This apparatus maintains sample and reference on the same temperature gradients and records the differences in power required to do so.