This book is a valuable read for a diverse group of researchers and practitioners who analyze assessment data and construct test instruments. It focuses on the use of classical test theory (CTT) and item response theory (IRT), which are often required in the fields of psychology (e.g. for measuring psychological traits), health (e.g. for measuring the severity of disorders), and education (e.g. for measuring student performance), and makes these analytical tools accessible to a broader audience. Having taught assessment subjects to students from diverse backgrounds for a number of years, the three authors have a wealth of experience in presenting educational measurement topics, in-depth concepts and applications in an accessible format. As such, the book addresses the needs of readers who use CTT and IRT in their work but do not necessarily have an extensive mathematical background. The book also sheds light on common misconceptions in applying measurement models, and presents an integrated approach to different measurement methods, such as contrasting CTT with IRT and multidimensional IRT models with unidimensional IRT models. Wherever possible, comparisons between models are explicitly made. In addition, the book discusses concepts for test equating and differential item functioning, as well as Bayesian IRT models and plausible values using simple examples. This book can serve as a textbook for introductory courses on educational measurement, as supplementary reading for advanced courses, or as a valuable reference guide for researchers interested in analyzing student assessment data.

Educational Tests and Measurements in the Age of Accountability is a core text for use in a first level graduate course in educational measurement and testing. In addition to covering the topics traditionally found in core textbooks for this course, this text also provides coverage of contemporary topics (including national testing programs, international achievement comparisons, the value added assessment of schools and teachers, and the public policy debate on selective admissions vs. affirmative minority enrollment).

By 1990 the wireless revolution had begun. In late 2000, Mike Golio gave the world a significant tool to use in this revolution: The RF and Microwave Handbook. Since then, wireless technology spread across the globe with unprecedented speed, fueled by 3G and 4G mobile technology and the proliferation of wireless LANs. Updated to reflect this tremendous growth, the second edition of this widely embraced, bestselling handbook divides its coverage conveniently into a set of three books, each focused on a particular aspect of the technology. Six new chapters cover WiMAX, broadband cable, bit error ratio (BER) testing, high-power PAs (power amplifiers), heterojunction bipolar transistors (HBTs), as well as an overview of microwave engineering. Over 100 contributors, with diverse backgrounds in academic, industrial, government, manufacturing, design, and research reflect the breadth and depth of the field. This eclectic mix of contributors ensures that the coverage balances fundamental technical issues with the important business and marketing constraints that define commercial RF and microwave engineering. Focused chapters filled with formulas, charts, graphs, diagrams, and tables make the information easy to locate and apply to practical cases. The new format, three tightly focused volumes, provides not only increased information but also ease of use. You can find the information you need quickly, without wading through material you don’t immediately need, giving you access to the caliber of data you have come to expect in a much more user-friendly format.

Which types of validity evidence should be considered when determining whether a scale is appropriate for a given measurement situation? What about reliability evidence? Using clear explanations illustrated by examples from across the social and behavioral sciences, this engaging text prepares students to make effective decisions about the selection, administration, scoring, interpretation, and development of measurement instruments. Coverage includes the essential measurement topics of scale development, item writing and analysis, and reliability and validity, as well as more advanced topics such as exploratory and confirmatory factor analysis, item response theory, diagnostic classification models, test bias and fairness, standard setting, and equating. End-of-chapter exercises (with answers) emphasize both computations and conceptual understanding to encourage readers to think critically about the material. ÿ

Handbook of Microwave Component Measurements Second Edition is a fully updated, complete reference to this topic, focusing on the modern measurement tools, such as a Vector Network Analyzer (VNA), gathering in one place all the concepts, formulas, and best practices of measurement science. It includes basic concepts in each chapter as well as appendices which provide all the detail needed to understand the science behind microwave measurements. The book offers an insight into the best practices for ascertaining the true nature of the device-under-test (DUT), optimizing the time to setup and measure, and to the greatest extent possible, remove the effects of the measuring equipment from that result. Furthermore, the author writes with a simplicity that is easily accessible to the student or new engineer, yet is thorough enough to provide details of measurement science for even the most advanced applications and researchers. This welcome new edition brings forward the most modern techniques used in industry today, and recognizes that more new techniques have developed since the first edition published in 2012. Whilst still focusing on the VNA, these techniques are also compatible with other vendor's advanced equipment, providing a comprehensive industry reference.