A high-pressure, high-temperature furnace system is described for crystal growth experiments using crucibles up to 13 cm in diameter and 26 cm high. The vertical temperature gradient is electronically controlled during growth such that the ends of the crucible can be maintained at temperatures above or below the crucible center. Temperatures up to 2800C can be maintained at pressures up to 50 atmospheres. A vacuum capability up to .000001 torr at 1800C has been incorporated into the system. Single crystals of alpha silicon carbide grown in this system at 2600C are described to illustrate its use. (Author).

This volume deals with the technologies of crystal fabrication, of crystal machining, and of epilayer production and is the first book on industrial and scientific aspects of crystal and layer production. The major industrial crystals are treated: Si, GaAs, GaP, InP, CdTe, sapphire, oxide and halide scintillator crystals, crystals for optical, piezoelectric and microwave applications and more. Contains 29 contributions from leading crystal technologists covering the following topics: * General aspects of crystal growth technology * Silicon * Compound semiconductors * Oxides and halides * Crystal machining * Epitaxy and layer deposition Scientific and technological problems of production and machining of industrial crystals are discussed by top experts, most of them from the major growth industries and crystal growth centers. In addition, it will be useful for the users of crystals, for teachers and graduate students in materials sciences, in electronic and other functional materials, chemical and metallurgical engineering, micro-and optoelectronics including nanotechnology, mechanical engineering and precision-machining, microtechnology, and in solid-state sciences.

Volumes 11 and 12 contain the papers read at the Fourth All-Union Conference on Crystal Growth in Tsakhkadzor, September 17-22, 1972; this volume contains papers on crystal growth from melts, from low-temperature solutions, hydrothermal solutions, and hot solutions, and also from the gas state, including processes involving reactions. In addition, there are papers on crystal perfection in relation to conditions of formation and the effects of electric and mag netic fields on crystallization. These papers reflect researches directed to the development and industrial production of perfect crystals required for advanced techniques in solid-state physics and chemistry, as well as for other purposes such as novel materials. There are many different scientific and technical problems in producing large perfect single crystals, and advances in this area made in the USSR and elsewhere are reflected in the papers in both volumes. On the one hand, any particular defective structure in a crystal originates from some mechanism and growth conditions; in particular, inclusions are trapped on account of the physicochemical parameters of the melt, the surface processes, and the sta bility of the growth front under particular crystallization conditions. Further, impurity trap ping is decisively influenced by the surface kinetics, growth-front stability, composition and structure of the boundary layer, any complexes present in the liquid, and (of course) the crys tallochemical relationships between the impurity and the crystal.

The report describes the design, installation, calibration, and test of a unique high pressure, high temperature crystal growth system of the Solid State Sciences Laboratory of Air Force Cambridge Research Laboratories. A number of modifications and innovations that make the system unique are described. Pictures and diagrams of the crystal growth system are sufficiently complete to provide substantial aid in the operation or duplication of this facility. This furnace has been operated above 3000C at internal pressures of twenty atmospheres and at a vacuum in the low 0.00001 Torr range. (Author).

Silicon Carbide (SiC) and its polytypes, used primarily for grinding and high temperature ceramics, have been a part of human civilization for a long time. The inherent ability of SiC devices to operate with higher efficiency and lower environmental footprint than silicon-based devices at high temperatures and under high voltages pushes SiC on the verge of becoming the material of choice for high power electronics and optoelectronics. What is more important, SiC is emerging to become a template for graphene fabrication, and a material for the next generation of sub-32nm semiconductor devices. It is thus increasingly clear that SiC electronic systems will dominate the new energy and transport technologies of the 21st century. In 21 chapters of the book, special emphasis has been placed on the materials aspects and developments thereof. To that end, about 70% of the book addresses the theory, crystal growth, defects, surface and interface properties, characterization, and processing issues pertaining to SiC. The remaining 30% of the book covers the electronic device aspects of this material. Overall, this book will be valuable as a reference for SiC researchers for a few years to come. This book prestigiously covers our current understanding of SiC as a semiconductor material in electronics. The primary target for the book includes students, researchers, material and chemical engineers, semiconductor manufacturers and professionals who are interested in silicon carbide and its continuing progression.