Investigating the incessant technology growth and the even higher complexity of engineering systems, one of the crucial requirements to confidently steer both scientific and industrial challenges is to identify an appropriate measurement approach. A general process can be considered effective and under control if the following elements are consciously and cyclically managed: numeric target, adequate tools, output analysis, and corrective actions. The role of metrology is to rigorously harmonize this virtuous circle, providing guidance in terms of instruments, standards, and techniques to improve the robustness and the accuracy of the results. This book is designed to offer an interdisciplinary experience into the science of measurement, not only covering high-level measurement strategies but also supplying analytical details and experimental setups.

Discover the nonlinear methods and tools needed to design real-world microwave circuits with this tutorial guide. Balancing theoretical background with practical tools and applications, it covers everything from the basic properties of nonlinear systems such as gain compression, intermodulation and harmonic distortion, to nonlinear circuit analysis and simulation algorithms, and state-of-the-art equivalent circuit and behavioral modeling techniques. Model formulations discussed in detail include time-domain transistor compact models and frequency-domain linear and nonlinear scattering models. Learn how to apply these tools to designing real circuits with the help of a power amplifier design example, which covers all stages from active device model extraction and the selection of bias and terminations, through to performance verification. Realistic examples, illustrative insights and clearly conveyed mathematical formalism make this an essential learning aid for both professionals working in microwave and RF engineering and graduate students looking for a hands-on guide to microwave circuit design.

GaN Transistor Modeling for RF and Power Electronics: Using The ASM-GaN-HEMT Model covers all aspects of characterization and modeling of GaN transistors for both RF and Power electronics applications. Chapters cover an in-depth analysis of the industry standard compact model ASM-HEMT for GaN transistors. The book details the core surface-potential calculations and a variety of real device effects, including trapping, self-heating, field plate effects, and more to replicate realistic device behavior. The authors also include chapters on step-by-step parameter extraction procedures for the ASM-HEMT model and benchmark test results. GaN is the fastest emerging technology for RF circuits as well as power electronics. This technology is going to grow at an exponential rate over the next decade. This book is envisioned to serve as an excellent reference for the emerging GaN technology, especially for circuit designers, materials science specialists, device engineers and academic researchers and students. - Provides an overview of the operation and physics of GaN-based transistors - Features in-depth description (by the developers of the model) of all aspects of the industry standard ASM-HEMT model for GaN circuits - Details parameter extraction of GaN devices and measurement data requirements for GaN model extraction

This volume comprises a selection of works presented at the Numerical and Evolutionary Optimization (NEO 2016) workshop held in September 2016 in Tlalnepantla, Mexico. The development of powerful search and optimization techniques is of great importance in today’s world and requires researchers and practitioners to tackle a growing number of challenging real-world problems. In particular, there are two well-established and widely known fields that are commonly applied in this area: (i) traditional numerical optimization techniques and (ii) comparatively recent bio-inspired heuristics. Both paradigms have their unique strengths and weaknesses, allowing them to solve some challenging problems while still failing in others. The goal of the NEO workshop series is to bring together experts from these and related fields to discuss, compare and merge their complementary perspectives in order to develop fast and reliable hybrid methods that maximize the strengths and minimize the weaknesses of the underlying paradigms. In doing so, NEO promotes the development of new techniques that are applicable to a broader class of problems. Moreover, NEO fosters the understanding and adequate treatment of real-world problems particularly in emerging fields that affect all of us, such as healthcare, smart cities, big data, among many others. The extended papers presented in the book contribute to achieving this goal.

Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simulations of integrated circuits in conjunction with models of the used RF probes. This allows to comprehend the observed distortions and successfully resolve the root of the distortions.

em style="mso-bidi-font-style: normal;"Wireless Information and Power Transfer offers an authoritative and comprehensive guide to the theory, models, techniques, implementation and application of wireless information and power transfer (WIPT) in energy-constrained wireless communication networks. With contributions from an international panel of experts, this important resource covers the various aspects of WIPT systems such as, system modeling, physical layer techniques, resource allocation and performance analysis. The contributors also explore targeted research problems typically encountered when designing WIPT systems.

This book describes vector network analyzer measurements and uncertainty assessments, particularly in waveguide test-set environments, in order to establish their compatibility to the International System of Units (SI) for accurate and reliable characterization of communication networks. It proposes a fully analytical approach to measurement uncertainty evaluation, while also highlighting the interaction and the linear propagation of different uncertainty sources to compute the final uncertainties associated with the measurements. The book subsequently discusses the dimensional characterization of waveguide standards and the quality of the vector network analyzer (VNA) calibration techniques. The book concludes with an in-depth description of the novel verification artefacts used to assess the performance of the VNAs. It offers a comprehensive reference guide for beginners to experts, in both academia and industry, whose work involves the field of network analysis, instrumentation and measurements.